Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11934581 | Terminal vibration evaluation method and apparatus in game scenario, medium, and device | Yanhui Lu, Kai Hong, Shili XU, Haiyang Wu, Qitian Zhang +1 more | 2024-03-19 |
| 11922906 | Frame rate adjustment method, apparatus and device, computer-readable storage medium and computer program product | Shili XU, Kai Hong, Haiyang Wu, Qitian Zhang, Jingjing Chen | 2024-03-05 |
| 9824176 | Optical critical dimension target design | Jiangtao Hu, Bingqing Li | 2017-11-21 |
| 9239523 | Diffraction based overlay linearity testing | Jie Li, Silvio J. Rabello, Nigel P. Smith | 2016-01-19 |
| 9115987 | Optical metrology with multiple angles of incidence and/or azimuth angles | Shifang Li | 2015-08-25 |
| 8649630 | Method and apparatus for processing distorted image | — | 2014-02-11 |
| 8501501 | Measurement of a sample using multiple models | Ye Feng | 2013-08-06 |
| 8252608 | Measurement of a sample using multiple models | Ye Feng | 2012-08-28 |
| 8126694 | Modeling conductive patterns using an effective model | Jiangtao Hu, Yudong Hao | 2012-02-28 |
| 8062910 | Measurement of a sample using multiple models | Ye Feng | 2011-11-22 |
| 7465590 | Measurement of a sample using multiple models | Ye Feng | 2008-12-16 |
| 7450225 | Correction of optical metrology for focus offset | Yudong Hao, Ye Feng, Yongdong Liu | 2008-11-11 |
| 7362448 | Characterizing residue on a sample | Sangbong Lee, Jiangtao Hu, Chandra Saru Saravanan | 2008-04-22 |