YH

Yudong Hao

NI Nanometrics Incorporated: 2 patents #40 of 127Top 35%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
📍 Fremont, CA: #4,197 of 9,298 inventorsTop 50%
🗺 California: #149,087 of 386,348 inventorsTop 40%
Overall (All Time): #1,342,863 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
12386342 Holistic analysis of multidimensional sensor data for substrate processing equipment Chao Liu, Shifang Li, Andreas Schulze 2025-08-12
8126694 Modeling conductive patterns using an effective model Zhuan Liu, Jiangtao Hu 2012-02-28
7450225 Correction of optical metrology for focus offset Zhuan Liu, Ye Feng, Yongdong Liu 2008-11-11