Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12407407 | Method and device for constructing integrated space-terrestrial network | Yuanjie Li, Hewu Li, Jiayi Liu, Lixin Liu, Qian Wu +2 more | 2025-09-02 |
| 12242535 | Method, system for providing sight information and computer-readable recording medium | Yu-Hsien Li | 2025-03-04 |
| 11363008 | System and method for applications to share single sign on through lightweight directory access protocol (LDAP) integration | Minbao Li, Doug Shock, Steven L. Spak | 2022-06-14 |
| 10949242 | Development of embedded type devices and running method for embedded type virtual device and system | Hongjun Chen, Qiang Zhou, Jifeng Wen, Jiuhu Li, Dongfang Xu +4 more | 2021-03-16 |
| 10674315 | Method and device for judging intercity transportation mode based on mobile phone data | Yong LI, Zhen Tu, Weiling Wu, Li Su, Depeng Jin +6 more | 2020-06-02 |
| 10573174 | Method for judging highway abnormal event | Kai Zhao, Yufeng Bi, Yong LI, Depeng Jin, Weiling Wu +7 more | 2020-02-25 |
| 10573173 | Vehicle type identification method and device based on mobile phone data | Weiling Wu, Kai Zhao, Yong LI, Depeng Jin, Tao Mu +6 more | 2020-02-25 |
| 10523655 | System and method for applications to share single sign on through lightweight directory access protocol (LDAP) integration | Minbao Li, Doug Shock, Steven L. Spak | 2019-12-31 |
| 8671134 | Method and system for data distribution in high performance computing cluster | Qi Chen, Jun He, Guang Lei Li, Huo Ding Li | 2014-03-11 |
| 8600108 | Data processing system and method | Liang Tang, Shan Li, Lei Wang, Ke Liu | 2013-12-03 |
| 7949490 | Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology | Shifang Li, Weidong Yang | 2011-05-24 |
| 7783669 | Data flow management in generating profile models used in optical metrology | Hong Qiu, Junwei Bao, Jeffrey A. Chard, Miao Liu, Gang He +2 more | 2010-08-24 |
| 7765234 | Data flow management in generating different signal formats used in optical metrology | Hong Qiu, Junwei Bao, Jeffrey A. Chard, Miao Liu, Gang He +2 more | 2010-07-27 |
| 7729873 | Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology | Shifang Li, Weidung Yang | 2010-06-01 |
| 7639375 | Determining transmittance of a photomask using optical metrology | Sanjay K. Yedur, Shifang Li, Youxian Wen, Hanyou Chu, Ying Ying Luo | 2009-12-29 |
| 7627392 | Automated process control using parameters determined with approximation and fine diffraction models | Shifang Li, Weidung Yang, Manuel Madriaga | 2009-12-01 |
| 7617075 | Library accuracy enhancment and evaluation | Shifang Li, Junwei Bao | 2009-11-10 |
| 7515283 | Parallel profile determination in optical metrology | Tri Thanh Khuong, Junwei Bao, Jeffrey A. Chard, Ying Zhu, Sachin G. Deshpande +2 more | 2009-04-07 |
| 7469192 | Parallel profile determination for an optical metrology system | Tri Thanh Khuong, Junwei Bao, Jeffrey A. Chard, Ying Zhu, Sachin G. Deshpande +2 more | 2008-12-23 |
| 7421414 | Split machine learning systems | Junwei Bao | 2008-09-02 |
| 7302367 | Library accuracy enhancement and evaluation | Shifang Li, Junwei Bao | 2007-11-27 |