Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9127927 | Techniques for optimized scatterometry | Jonathan Iloreta, Paul Aoyagi, Hanyou Chu, Peilin Jiang, Mikhail Sushchik +2 more | 2015-09-08 |
| 7783669 | Data flow management in generating profile models used in optical metrology | Hong Qiu, Junwei Bao, Wei Liu, Miao Liu, Gang He +2 more | 2010-08-24 |
| 7765234 | Data flow management in generating different signal formats used in optical metrology | Hong Qiu, Junwei Bao, Wei Liu, Miao Liu, Gang He +2 more | 2010-07-27 |
| 7667858 | Automated process control using optical metrology and a correlation between profile models and key profile shape variables | Junwei Bao, Manuel Madriaga | 2010-02-23 |
| 7596422 | Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables | Junwei Bao | 2009-09-29 |
| 7518740 | Evaluating a profile model to characterize a structure to be examined using optical metrology | Junwei Bao, Youxian Wen, Sanjay K. Yedur | 2009-04-14 |
| 7515283 | Parallel profile determination in optical metrology | Tri Thanh Khuong, Junwei Bao, Wei Liu, Ying Zhu, Sachin G. Deshpande +2 more | 2009-04-07 |
| 7469192 | Parallel profile determination for an optical metrology system | Tri Thanh Khuong, Junwei Bao, Wei Liu, Ying Zhu, Sachin G. Deshpande +2 more | 2008-12-23 |
| 6823230 | Tool path planning process for component by layered manufacture | Vikram R. Jamalabad, Charles J. Gasdaska | 2004-11-23 |