Issued Patents All Time
Showing 26–50 of 57 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7945833 | Method and apparatus for pipelined scan compression | Nur A. Touba, Boryau (Jack) Sheu, Shianling Wu, Zhigang Jiang | 2011-05-17 |
| 7925947 | X-canceling multiple-input signature register (MISR) for compacting output responses with unknowns | Nur A. Touba | 2011-04-12 |
| 7904773 | Multiple-capture DFT system for scan-based integrated circuits | Meng-Chyi Lin, Xiaoqing Wen, Hsin-Po Wang, Chi-Chan Hsu, Shih-Chia Kao +1 more | 2011-03-08 |
| 7904857 | Computer-aided design system to automate scan synthesis at register-transfer level | Xiaoqing Wen | 2011-03-08 |
| 7783940 | Apparatus for redundancy reconfiguration of faculty memories | Lizhen Yu, Shianling Wu, Zhigang Jiang | 2010-08-24 |
| 7779322 | Compacting test responses using X-driven compactor | Zhigang Wang, Shianling Wu, Xiaoqing Wen, Boryau (Jack) Sheu, Zhigang Jiang | 2010-08-17 |
| 7779323 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao +1 more | 2010-08-17 |
| 7747920 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Xiaoqing Wen | 2010-06-29 |
| 7735049 | Mask network design for scan-based integrated circuits | Xiaoqing Wen, Boryau (Jack) Sheu | 2010-06-08 |
| 7721172 | Method and apparatus for broadcasting test patterns in a scan-based integrated circuit | Boryau (Jack) Sheu, Zhigang Jiang, Zhigang Wang, Shianling Wu | 2010-05-18 |
| 7721173 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh +2 more | 2010-05-18 |
| 7590905 | Method and apparatus for pipelined scan compression | Khader S. Abdel-Hafez, Boryau (Jack) Sheu, Shianling Wu | 2009-09-15 |
| 7552373 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh +2 more | 2009-06-23 |
| 7512851 | Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit | Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau (Jack) Sheu, Fei-Sheng Hsu, Augusli Kifli +4 more | 2009-03-31 |
| 7451371 | Multiple-capture DFT system for scan-based integrated circuits | Xiaoqing Wen | 2008-11-11 |
| 7444567 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Xiaoqing Wen, Khader S. Abdel-Hafez, Shyh-Horng Lin, Hsin-Po Wang, Ming-Tung Chang +4 more | 2008-10-28 |
| 7434126 | Computer-aided design (CAD) multiple-capture DFT system for detecting or locating crossing clock-domain faults | Po-Ching Hsu, Xiaoqing Wen | 2008-10-07 |
| 7412637 | Method and apparatus for broadcasting test patterns in a scan based integrated circuit | Boryau (Jack) Sheu, Zhigang Jiang, Zhigang Wang, Shianling Wu | 2008-08-12 |
| 7412672 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Xiaoqing Wen, Shyh-Horng Lin, Khader S. Abdel-Hafez | 2008-08-12 |
| 7331032 | Computer-aided design system to automate scan synthesis at register-transfer level | Augusli Kifli, Fei-Sheng Hsu, Xiaoqing Wen, Shih-Chia Kao, Shyh-Horng Lin +1 more | 2008-02-12 |
| 7284175 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Ming-Tung Chang, Hao-Jan Chao, Xiaoqing Wen, Po-Ching Hsu | 2007-10-16 |
| 7260756 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test | Po-Ching Hsu, Xiaoqing Wen | 2007-08-21 |
| 7231570 | Method and apparatus for multi-level scan compression | Khader S. Abdel-Hafez, Boryau (Jack) Sheu, Shianling Wu | 2007-06-12 |
| 7228479 | IEEE Std. 1149.4 compatible analog BIST methodology | Chauchin Su, Shyh-Horng Lin | 2007-06-05 |
| 7210082 | Method for performing ATPG and fault simulation in a scan-based integrated circuit | Khader S. Abdel-Hafez, Boryau (Jack) Sheu, Zhigang Wang, Zhigang Jiang | 2007-04-24 |