Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9057763 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2015-06-16 |
| 9026875 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2015-05-05 |
| 8769359 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Luang-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2014-07-01 |
| 8458544 | Multiple-capture DFT system to reduce peak capture power during self-test or scan test | Laung-Terng Wang, Shianling Wu | 2013-06-04 |
| 8091002 | Multiple-capture DFT system to reduce peak capture power during self-test or scan test | Laung-Terng Wang, Shianling Wu, Zhigang Jiang, Jinsong Liu, Lizhen Yu +3 more | 2012-01-03 |
| 7779323 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2010-08-17 |
| 7284175 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Laung-Terng Wang, Ming-Tung Chang, Xiaoqing Wen, Po-Ching Hsu | 2007-10-16 |
| 7191373 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Laung-Terng Wang, Ming-Tung Chang, Shyh-Horng Lin, Jaehee Lee, Hsin-Po Wang +6 more | 2007-03-13 |
| 7058869 | Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits | Khader S. Abdel-Hafez, Xiaoqing Wen, Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao +1 more | 2006-06-06 |
| 7007213 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2006-02-28 |