Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320839 | Distributed test pattern generation and synchronization | Peter Wohl, Michael Dylan Dsouza | 2025-06-03 |
| 11493971 | Power estimation system | Alexander John Wakefield | 2022-11-08 |
| 9696377 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin +2 more | 2017-07-04 |
| 7721173 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin +2 more | 2010-05-18 |
| 7590905 | Method and apparatus for pipelined scan compression | Laung-Terng Wang, Boryau (Jack) Sheu, Shianling Wu | 2009-09-15 |
| 7552373 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin +2 more | 2009-06-23 |
| 7512851 | Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Xiaoqing Wen, Boryau (Jack) Sheu, Fei-Sheng Hsu, Augusli Kifli +4 more | 2009-03-31 |
| 7444567 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang, Xiaoqing Wen, Shyh-Horng Lin, Hsin-Po Wang, Ming-Tung Chang +4 more | 2008-10-28 |
| 7412672 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Xiaoqing Wen, Shyh-Horng Lin | 2008-08-12 |
| 7231570 | Method and apparatus for multi-level scan compression | Laung-Terng Wang, Boryau (Jack) Sheu, Shianling Wu | 2007-06-12 |
| 7210082 | Method for performing ATPG and fault simulation in a scan-based integrated circuit | Laung-Terng Wang, Boryau (Jack) Sheu, Zhigang Wang, Zhigang Jiang | 2007-04-24 |
| 7124342 | Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits | Laung-Terng Wang, Xiaoqing Wen, Boryau (Jack) Sheu, Shun-Miin (Sam) Wang | 2006-10-17 |
| 7058869 | Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits | Xiaoqing Wen, Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Hao-Jan Chao +1 more | 2006-06-06 |
| 7032148 | Mask network design for scan-based integrated circuits | Laung-Terng Wang, Shun-Miin (Sam) Wang, Xiaoqing Wen, Boryau (Jack) Sheu | 2006-04-18 |