Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7512851 | Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau (Jack) Sheu, Fei-Sheng Hsu +4 more | 2009-03-31 |
| 7124342 | Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau (Jack) Sheu | 2006-10-17 |
| 7032148 | Mask network design for scan-based integrated circuits | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau (Jack) Sheu | 2006-04-18 |