Issued Patents All Time
Showing 1–25 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12318692 | Virtual object control method and apparatus, terminal, and storage medium | Jiaqi Pan, Ying Deng, Ke Mao, Weixiang YU, Jing Kou +1 more | 2025-06-03 |
| 9696377 | Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Hsin-Po Wang, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh +2 more | 2017-07-04 |
| 9678156 | Multiple-capture DFT method for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu | 2017-06-13 |
| 9316688 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test | Laung-Terng Wang, Po-Ching Hsu | 2016-04-19 |
| 9274168 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test | Laung-Terng Wang, Po-Ching Hsu | 2016-03-01 |
| 9091730 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test | Laung-Terng Wang, Po-Ching Hsu | 2015-07-28 |
| 8775985 | Computer-aided design system to automate scan synthesis at register-transfer level | Laung-Terng Wang | 2014-07-08 |
| 8589751 | Don't-care-bit identification method and don't-care-bit identification program | Kohei Miyase, Seiji Kajihara | 2013-11-19 |
| 8543950 | Computer-aided design system to automate scan synthesis at register-transfer level | Laung-Terng Wang, Augusli Kifli, Fei-Sheng Hsu, Shih-Chia Kao, Shyh-Horng Lin +1 more | 2013-09-24 |
| 8453023 | Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable medium | Kohei Miyase, Seiji Kajihara | 2013-05-28 |
| 8429472 | Generating device, generating method, and program | Kohei Miyase, Seiji Kajihara, Yuta YAMATO | 2013-04-23 |
| 8219945 | Computer-aided design system to automate scan synthesis at register-transfer level | Laung-Terng Wang | 2012-07-10 |
| 8117513 | Test method and test program of semiconductor logic circuit device | Seiji Kajihara | 2012-02-14 |
| 8001437 | Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit | Kohei Miyase, Seiji Kajihara | 2011-08-16 |
| 7979765 | Generating device, generating method, program and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-07-12 |
| 7971118 | Conversion device, conversion method, program, and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-28 |
| 7962822 | Generating device, generating method, program and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-14 |
| 7945830 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang | 2011-05-17 |
| 7913144 | Diagnostic device, diagnostic method, program, and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-03-22 |
| 7904857 | Computer-aided design system to automate scan synthesis at register-transfer level | Laung-Terng Wang | 2011-03-08 |
| 7904773 | Multiple-capture DFT system for scan-based integrated circuits | Laung-Terng Wang, Meng-Chyi Lin, Hsin-Po Wang, Chi-Chan Hsu, Shih-Chia Kao +1 more | 2011-03-08 |
| 7779322 | Compacting test responses using X-driven compactor | Zhigang Wang, Laung-Terng Wang, Shianling Wu, Boryau (Jack) Sheu, Zhigang Jiang | 2010-08-17 |
| 7779323 | Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test | Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang +1 more | 2010-08-17 |
| 7747920 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang | 2010-06-29 |
| 7743306 | Test vector generating method and test vector generating program of semiconductor logic circuit device | Seiji Kajihara | 2010-06-22 |