Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9702927 | Test pattern generation device, fault detection system, test pattern generation method, program and recording medium | Yasuo Sato | 2017-07-11 |
| 9383408 | Fault detection system, generation circuit, and program | Yasuo Sato, Senling Wang, Kohei Miyase | 2016-07-05 |
| 9316684 | Semiconductor device, detection method and program | Yasuo Sato, Michiko Inoue, Tomokazu Yoneda, Hyunbean Yi, Yukiya Miura | 2016-04-19 |
| 9075110 | Fault detection system, acquisition apparatus, fault detection method, program, and non-transitory computer-readable medium | Yasuo Sato | 2015-07-07 |
| 8589751 | Don't-care-bit identification method and don't-care-bit identification program | Kohei Miyase, Xiaoqing Wen | 2013-11-19 |
| 8453023 | Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable medium | Kohei Miyase, Xiaoqing Wen | 2013-05-28 |
| 8429472 | Generating device, generating method, and program | Kohei Miyase, Xiaoqing Wen, Yuta YAMATO | 2013-04-23 |
| 8117513 | Test method and test program of semiconductor logic circuit device | Xiaoqing Wen | 2012-02-14 |
| 8037387 | Conversion device, conversion method, program, and recording medium | Kohei Miyase, Xiaqing Wen, Yoshihiro Minamoto, Hiroshi Date | 2011-10-11 |
| 8001437 | Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit | Xiaoqing Wen, Kohei Miyase | 2011-08-16 |
| 7979765 | Generating device, generating method, program and recording medium | Xiaoqing Wen, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-07-12 |
| 7971118 | Conversion device, conversion method, program, and recording medium | Xiaoqing Wen, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-28 |
| 7962822 | Generating device, generating method, program and recording medium | Xiaoqing Wen, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-14 |
| 7913144 | Diagnostic device, diagnostic method, program, and recording medium | Xiaoqing Wen, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-03-22 |
| 7743306 | Test vector generating method and test vector generating program of semiconductor logic circuit device | Xiaoqing Wen | 2010-06-22 |
| 7478295 | Method and apparatus of fault diagnosis for integrated logic circuits | Xiaoqing Wen | 2009-01-13 |
| 7159143 | Method for evaluating delay test quality | Sadami Takeoka | 2007-01-02 |
| 6799292 | Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit | Sadami Takeoka, Sudhakar Reddy | 2004-09-28 |