Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7613972 | Semiconductor integrated circuit, and designing method and testing method thereof | Shinichi Yoshimura | 2009-11-03 |
| 7610533 | Semiconductor integrated circuit and method for testing the same | Takashi Ishimura | 2009-10-27 |
| 7590908 | Semiconductor integrated circuit and method for testing the same | Takashi Ishimura | 2009-09-15 |
| 7475378 | Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-out | — | 2009-01-06 |
| 7348595 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Mitsuyasu Ohta, Osamu Ichikawa, Masayoshi Yoshimura | 2008-03-25 |
| 7302658 | Methods for evaluating quality of test sequences for delay faults and related technology | Mitsuyasu Ohta | 2007-11-27 |
| 7203913 | Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same | Mitsuyasu Ohta | 2007-04-10 |
| 7197725 | Semiconductor integrated circuit and testing method for the same | Mitsuyasu Ohta, Osamu Ichikawa, Masayoshi Yoshimura, Takashi Ishimura | 2007-03-27 |
| 7171600 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Mitsuyasu Ohta, Osamu Ichikawa, Masayoshi Yoshimura | 2007-01-30 |
| 7159143 | Method for evaluating delay test quality | Seiji Kajihara | 2007-01-02 |
| 7032196 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Mitsuyasu Ohta, Osamu Ichikawa, Masayoshi Yoshimura | 2006-04-18 |
| 7017135 | Method of designing semiconductor integrated circuit utilizing a scan test function | Takahiro Ichinomiya, Akira Motohara | 2006-03-21 |
| 6799292 | Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit | Sudhakar Reddy, Seiji Kajihara | 2004-09-28 |
| 6734549 | Semiconductor device having a device for testing the semiconductor | Mitsuyasu Ohta, Osamu Ichikawa, Masayoshi Yoshimura | 2004-05-11 |
| 6708301 | Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor | Mitsuyasu Ohta, Toshihiro Hiraoka | 2004-03-16 |
| 6625784 | Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same | Mitsuyasu Ohta | 2003-09-23 |
| 6615389 | Database for designing integrated circuit device, and method for designing integrated circuit device | Mitsuyasu Ohta, Osamu Ichikawa | 2003-09-02 |
| 6499125 | Method for inserting test circuit and method for converting test data | Mitsuyasu Ohta | 2002-12-24 |
| 6427218 | Method of generating test pattern for semiconductor integrated circuit and method of testing the same | — | 2002-07-30 |
| 6282506 | Method of designing semiconductor integrated circuit | Takahiro Ichinomiya, Akira Motohara | 2001-08-28 |
| 6271677 | Semiconductor integrated circuit and method for testing the semiconductor integrated circuit | Mitsuyasu Ohta, Toshinori Hosokawa, Osamu Ichikawa | 2001-08-07 |
| 6205566 | Semiconductor integrated circuit, method for designing the same, and storage medium where design program for semiconductor integrated circuit is stored | — | 2001-03-20 |
| 5430736 | Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit | Akira Motohara | 1995-07-04 |