Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7275188 | Method and apparatus for burn-in of semiconductor devices | Moussa Sobaiti, Robert Shrank, Yousif Jirjis | 2007-09-25 |
| 6934897 | Scheduling the concurrent testing of multiple cores embedded in an integrated circuit | Nilanjan Mukherjee, Chien-Chung Tsai, Wu-Tung Cheng, Omer Ghazi Samman, Yahya M. Z. Mustafa +2 more | 2005-08-23 |
| 6799292 | Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit | Sadami Takeoka, Seiji Kajihara | 2004-09-28 |