Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7348595 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura | 2008-03-25 |
| 7302658 | Methods for evaluating quality of test sequences for delay faults and related technology | Sadami Takeoka | 2007-11-27 |
| 7203913 | Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same | Sadami Takeoka | 2007-04-10 |
| 7197725 | Semiconductor integrated circuit and testing method for the same | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura, Takashi Ishimura | 2007-03-27 |
| 7171600 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura | 2007-01-30 |
| 7032196 | Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura | 2006-04-18 |
| 6734549 | Semiconductor device having a device for testing the semiconductor | Sadami Takeoka, Osamu Ichikawa, Masayoshi Yoshimura | 2004-05-11 |
| 6708301 | Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor | Sadami Takeoka, Toshihiro Hiraoka | 2004-03-16 |
| 6651206 | Method of design for testability, test sequence generation method and semiconductor integrated circuit | Toshinori Hosokawa | 2003-11-18 |
| 6625784 | Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same | Sadami Takeoka | 2003-09-23 |
| 6615389 | Database for designing integrated circuit device, and method for designing integrated circuit device | Sadami Takeoka, Osamu Ichikawa | 2003-09-02 |
| 6499125 | Method for inserting test circuit and method for converting test data | Sadami Takeoka | 2002-12-24 |
| 6271677 | Semiconductor integrated circuit and method for testing the semiconductor integrated circuit | Toshinori Hosokawa, Sadami Takeoka, Osamu Ichikawa | 2001-08-07 |
| 6253343 | Method of design for testability test sequence generation method and semiconductor integrated circuit | Toshinori Hosokawa | 2001-06-26 |
| 6119250 | Semiconductor integrated circuit | Kazuko Nishimura, Hironori Akamatsu, Akira Matsuzawa | 2000-09-12 |
| 5978948 | Semiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereof | — | 1999-11-02 |
| 5617427 | Method for generating test sequences for detecting faults in target scan logical blocks | Akira Motohara | 1997-04-01 |
| 5483543 | Test sequence generation method | Toshinori Hosokawa, Akira Motohara | 1996-01-09 |
| 5305328 | Method of test sequence generation | Akira Motohara, Toshinori Hosokawa | 1994-04-19 |