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Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa |
2008-03-25 |
| 7197725 |
Semiconductor integrated circuit and testing method for the same |
Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa, Takashi Ishimura |
2007-03-27 |
| 7171600 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa |
2007-01-30 |
| 7032196 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa |
2006-04-18 |
| 6734549 |
Semiconductor device having a device for testing the semiconductor |
Sadami Takeoka, Mitsuyasu Ohta, Osamu Ichikawa |
2004-05-11 |
| 6708315 |
Method of design for testability, method of design for integrated circuits and integrated circuits |
Toshinori Hosokawa |
2004-03-16 |
| 5512847 |
BiCMOS tri-state output driver |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Uragami +1 more |
1996-04-30 |
| 5495183 |
Level conversion circuitry for a semiconductor integrated circuit |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Urragami +1 more |
1996-02-27 |
| 5245224 |
Level conversion circuitry for a semiconductor integrated circuit |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Uragami +1 more |
1993-09-14 |
| 5103120 |
Level conversion circuitry for a semiconductor integrated circuit |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Uragami +1 more |
1992-04-07 |
| 4983862 |
Semiconductor integrated circuit with a bi-MOS input circuit for providing input signals to an internal logic block |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Uragami +1 more |
1991-01-08 |
| 4879480 |
Bicmos gate array |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akiro Uragami +1 more |
1989-11-07 |
| 4689503 |
Level conversion circuitry for a semiconductor integrated circuit utilizing bis CMOS circuit elements |
Yukio Suzuki, Ikuro Masuda, Masahiro Iwamura, Shinji Kadono, Akira Uragami +1 more |
1987-08-25 |
| 4443812 |
High-breakdown-voltage semiconductor device |
Ichiro Imaizumi, Masatoshi Kimura, Shikayuki Ochi, Takashi Yamaguchi, Toyomasa Koda |
1984-04-17 |
| 4423433 |
High-breakdown-voltage resistance element for integrated circuit with a plurality of multilayer, overlapping electrodes |
Ichiro Imaizumi, Shikayuki Ochi, Masatoshi Kimura, Takashi Yamaguchi, Toyomasa Koda |
1983-12-27 |
