Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6708301 | Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor | Mitsuyasu Ohta, Sadami Takeoka | 2004-03-16 |
| 6510535 | Method of design for testability for integrated circuits | Toshinori Hosokawa | 2003-01-21 |