Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9316684 | Semiconductor device, detection method and program | Yasuo Sato, Seiji Kajihara, Michiko Inoue, Hyunbean Yi, Yukiya Miura | 2016-04-19 |
| 8959001 | Test pattern generation for semiconductor integrated circuit | Michiko Inoue, Yasuo Sato | 2015-02-17 |