Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7904773 | Multiple-capture DFT system for scan-based integrated circuits | Laung-Terng Wang, Meng-Chyi Lin, Xiaoqing Wen, Hsin-Po Wang, Shih-Chia Kao +1 more | 2011-03-08 |
| 7444567 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang, Xiaoqing Wen, Khader S. Abdel-Hafez, Shyh-Horng Lin, Hsin-Po Wang +4 more | 2008-10-28 |
| 7191373 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Laung-Terng Wang, Ming-Tung Chang, Shyh-Horng Lin, Hao-Jan Chao, Jaehee Lee +6 more | 2007-03-13 |
| 6954887 | Multiple-capture DFT system for scan-based integrated circuits | Laung-Terng Wang, Meng-Chyi Lin, Xiaoqing Wen, Hsin-Po Wang, Shih-Chia Kao +1 more | 2005-10-11 |