Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906447 | Multi-channel static CT device | Zhiqiang Chen, Li Zhang, Xiaofei Xu, Le Shen, Hu Tang +2 more | 2024-02-20 |
| 11479369 | Baggage cart | Li Zhang, Zhiqiang Chen, Qingping Huang, Wenyuan Bi, Xin Jin +2 more | 2022-10-25 |
| 11215570 | Security inspection system and method | Li Zhang, Zhiqiang Chen, Qingping Huang, Wenyuan Bi, Xin Jin +2 more | 2022-01-04 |
| 10942290 | X-ray detection system and method | Li Zhang, Zhiqiang Chen, Yunda Sun, Xin Jin, Xiaofei Xu | 2021-03-09 |
| 10776558 | Testing system and testing method | Shih-Hsin Chen, Te-Hsun Fu | 2020-09-15 |
| 10379067 | Method and system for liquid detection | Zhiqiang Chen, Li Zhang, Tianyi Yang Dai, Ji Zhao, Xin Jin | 2019-08-13 |
| 10295481 | Detection system and method | Zhiqiang Chen, Li Zhang, Tianyi Yang Dai, Ji Zhao, Xin Jin | 2019-05-21 |
| 10175182 | CT detection method and CT device | Yongshun Xiao, Zhiqiang Chen, Ziran Zhao | 2019-01-08 |
| 8487645 | Through silicon via testing structure | Min-Hsiu Tsai, Chih-Mou Tseng | 2013-07-16 |
| 8468407 | Method for creating test clock domain during integrated circuit design, and associated computer readable medium | Min-Hsiu Tsai, Chih-Mou Tseng, Jen-Yang Wen, Chien-Mo Li | 2013-06-18 |
| 7512851 | Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit | Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau (Jack) Sheu, Fei-Sheng Hsu +4 more | 2009-03-31 |
| 7444567 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang, Xiaoqing Wen, Khader S. Abdel-Hafez, Shyh-Horng Lin, Hsin-Po Wang +4 more | 2008-10-28 |
| 7284175 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Laung-Terng Wang, Hao-Jan Chao, Xiaoqing Wen, Po-Ching Hsu | 2007-10-16 |
| 7191373 | Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques | Laung-Terng Wang, Shyh-Horng Lin, Hao-Jan Chao, Jaehee Lee, Hsin-Po Wang +6 more | 2007-03-13 |