Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11500018 | Asynchronous circuits and test methods | Ting-Yu Shen | 2022-11-15 |
| 11073552 | Design-for-test for asynchronous circuit elements | Kuan-Yen Huang, Ting-Yu Shen | 2021-07-27 |
| 11047911 | Asynchronous circuits and test methods | Ting-Yu Shen | 2021-06-29 |
| 10429440 | Design-for-test for asynchronous circuit elements | Kuan-Yen Huang, Ting-Yu Shen | 2019-10-01 |
| 9983264 | Multiple defect diagnosis method and machine readable media | Pei-Ying Hsueh, Chun-Yi Kuo, Chieh-Chih Che | 2018-05-29 |
| 9213799 | Systematic defect analysis method and machine readable media | Pei-Ying Hsueh, Chun-Yi Kuo, Po-Juei Chen | 2015-12-15 |
| 8468407 | Method for creating test clock domain during integrated circuit design, and associated computer readable medium | Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Jen-Yang Wen | 2013-06-18 |