Issued Patents All Time
Showing 26–50 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678020 | Apparatus and method for inspection of substrate defect | Joon-Seo Song, Woo-Seok Ko, Ji-Young Shin, Seong Jin YUN, Yu-Sin Yang +1 more | 2017-06-13 |
| 9659743 | Image creating method and imaging system for performing the same | Jung-Hwan Kim, Min Kook Kim, Yu-Sin Yang, Chung-Sam Jun | 2017-05-23 |
| 9455206 | Overlay measuring method and system, and method of manufacturing semiconductor device using the same | Seong Jin YUN, Woo-Seok Ko, Yu-Sin Yang, Chung-Sam Jun | 2016-09-27 |
| 9417055 | Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film | Sung Yoon Ryu, Chung-Sam Jun, Woo-Seok Ko, Ho-Jeong Kwak, Souk Kim +2 more | 2016-08-16 |
| 9333438 | Block studying tool for infant | Young Soon Kim | 2016-05-10 |
| 9261532 | Conductive atomic force microscope and method of operating the same | Hyun-Woo Kim, Woo-Seok Ko, Young Hwan Kim, Jeong Hoi Kim, Baek-man Sung +5 more | 2016-02-16 |
| 9196182 | Display device | Kwang-Hyun Baek, Bum-Suk Lee, So Yeon Yi, Kyu-Hun Lim, Jae Jin Choi | 2015-11-24 |
| 9194816 | Method of detecting a defect of a substrate and apparatus for performing the same | Min Ho Rim, Yu-Sin Yang, Yong-Deok Jeong, Hyung-Suk Cho | 2015-11-24 |
| 9155697 | Stable liquid compositions for treating stomatitis comprising epidermal growth factor | Sun Hee Kim, Chae Ha Yoon, Sun-Mee Yang, Sang-Hyun Nam, Kyeong-Sun Shin +2 more | 2015-10-13 |
| 9123503 | Methods of fabricating microelectronic substrate inspection equipment | Min Kook Kim, Woo-Seok Ko, Yu-Sin Yang, Chang-Hoon Choi | 2015-09-01 |
| 9036895 | Method of inspecting wafer | Young-Hoon Sohn, Yu-Sin Yang | 2015-05-19 |
| 8960714 | Side curtain airbag and airbag system comprising the same | Jae Hyung Kim, Hee Jun Kim, Jung-Hoon Youn, Dong-Jin Kwak, Ki-Jeong Kim +1 more | 2015-02-24 |
| 8902412 | Defect inspection apparatus and defect inspection method using the same | Young-Hoon Sohn, Yu-Sin Yang | 2014-12-02 |
| 8841824 | Broadband light illuminators | Woo-Seok Ko, Yu-Sin Yang, Sue-Jin Cho, Won-Don Joo, Min Kook Kim +1 more | 2014-09-23 |
| 8822358 | Polyester fabrics for airbag and preparation method thereof | Jae Hyung Kim, Dong-Jin Kwak, Jung-Hoon Youn, Sang-Mok Lee, Hee Jun Kim +1 more | 2014-09-02 |
| 8759763 | Method and apparatus to measure step height of device using scanning electron microscope | Young-Hoon Sohn, Jin Woo Lee, Yong-Deok Jeong, Yu-Sin Yang, Chung-Sam Jun | 2014-06-24 |
| 8729468 | Microelectronic substrate inspection equipment using helium ion microscopy | Min Kook Kim, Woo-Seok Ko, Yu-Sin Yang, Chang-Hoon Choi | 2014-05-20 |
| 8703405 | Methods of generating three-dimensional process window qualification | Young-Hoon Sohn, Yu-Sin Yang | 2014-04-22 |
| 8685440 | Nanoliposome using esterified lecithin and method for preparing the same, and composition for preventing or treating skin diseases comprising the same | Joon Pio Hong, Won Chul Kim, Chae Ha Yoon, Sang Wook Lee, Kyeong-Sun Shin +1 more | 2014-04-01 |
| 8409586 | Stable liquid formulation of human growth hormone | Sun Hee Kim, Yo Kyung Chung, Jae Young Chang, Min-Suk Lee, Seung Kook Park | 2013-04-02 |
| 8152354 | Light source unit, manufacturing method thereof, and display device having the same | Ki-hyun Hong, Hee-Won Ko | 2012-04-10 |
| 7923684 | Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles | Min-Sub Kang, Kwang-Sik Kim, Kyung-Ho Jung, Sung-Joong Kim | 2011-04-12 |
| 7698615 | Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory device | Eun-Suk Kang, Young-Joon Choi, Dae-Hyun Lee | 2010-04-13 |
| 7468512 | Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles | Min-Sub Kang, Kwang-Sik Kim, Kyung-Ho Jung, Sung-Joong Kim | 2008-12-23 |
| 7405817 | Method and apparatus for classifying defects of an object | Pil-Sik Hyun, Sun-Yong Choi, Chung-Sam Jun, Sang Min Kim | 2008-07-29 |