Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9714171 | Graphene-nano particle composite having nano particles crystallized therein at a high density | Steven H. Kim, Byung-Koo Son, Myoung-Sun Shin, Sung-Hun Ryu, Kyu-Hang Lee | 2017-07-25 |
| 9711256 | Graphene-nano particle composite having nanoparticles crystallized therein at a high density | Steven H. Kim, Byung-Koo Son, Myoung-Sun Shin, Sung-Hun Ryu, Kyu-Hang Lee | 2017-07-18 |
| 7573568 | Method and apparatus for detecting a photolithography processing error, and method and apparatus for monitoring a photolithography process | Yu-Sin Yang, Chung-Sam Jun, Sang-Mun Chon | 2009-08-11 |
| 7459810 | Stator of linear motor | Sang-Sub Jeong, Hyuk Lee | 2008-12-02 |
| 7446703 | Apparatus and method for receiving GPS signals in a mobile terminal | Chan Woo Park, Jeong-Bok Yang, Ki Hyun PARK, Tae-Il Eom | 2008-11-04 |
| 7405817 | Method and apparatus for classifying defects of an object | Pil-Sik Hyun, Sang-Kil Lee, Chung-Sam Jun, Sang Min Kim | 2008-07-29 |
| 7355729 | Apparatus and method for measuring a thickness of a substrate | Hwan-Shik Park, Chung-Sam Jun, Kye-Weon Kim | 2008-04-08 |
| 7310140 | Method and apparatus for inspecting a wafer surface | Tae-Min Eom, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee, Joung Soo Kim +2 more | 2007-12-18 |
| 7289661 | Apparatus and method for inspecting a substrate | Chung-Sam Jun, Kwang Soo Kim, Joo-Woo Kim, Jeong Hyun Choi, Dong-Jin Park | 2007-10-30 |
| 7280233 | Method and apparatus for inspecting an edge exposure area of a wafer | Koung-Su Shin, Chung-Sam Jun, Dong-Chun Lee, Kwang-Jun Yoon | 2007-10-09 |
| 7274471 | Systems and methods for measuring distance of semiconductor patterns | Koung-Su Shin, Kwang-Jun Yoon, Chung-Sam Jun, Dong-Jin Park | 2007-09-25 |
| 7271890 | Method and apparatus for inspecting defects | Joung Soo Kim, Yu-Sin Yang, Moon-kyung Kim, Sang-Mun Chon, Chung-Sam Jun | 2007-09-18 |
| 7186577 | Method for monitoring a density profile of impurities | Yun-Jung Jee, Chung-Sam Jun, Kwan-Woo Ryu | 2007-03-06 |
| 7113274 | Method and apparatus for inspecting a substrate | Yu-Sin Yang, Sang-Mun Chon, Chung-Sam Jun | 2006-09-26 |
| 7046760 | Method of measuring and controlling concentration of dopants of a thin film | Tae Kyoung Kim, Chung-Sam Jun, Jeong Hyun Choi | 2006-05-16 |
| 6927077 | Method and apparatus for measuring contamination of a semiconductor substrate | Tae-Min Eom, Yu-Sin Yang, Kwan-Woo Ryu, Park-Song Kim, Sang-Mun Chon +1 more | 2005-08-09 |
| 6869215 | Method and apparatus for detecting contaminants in ion-implanted wafer | Yu-Sin Yang, Sang-Mun Chon, Chung-Sam Jun, Kwan-Woo Ryu, Park-Song Kim +1 more | 2005-03-22 |
| 6815236 | Method of measuring a concentration of a material and method of measuring a concentration of a dopant of a semiconductor device | Tae Kyoung Kim, Chung-Sam Jun, Kwang Soo Kim, Koung-Su Shin, Jeong Hyun Choi +1 more | 2004-11-09 |
| 6800863 | Method for monitoring an ion implanter and ion implanter having a shadow jig for performing the same | Chung-Sam Jun, Dong-Chun Lee, Tae Kyoung Kim, Doo-Guen Song, Seung-Won Chae | 2004-10-05 |
| 5755469 | Wafer transfer blade | Keun-hong Ryoo, Jin-Ho Park | 1998-05-26 |
| 5676824 | Water purifier with means for indicating when filter replacement is due and for automatically initiating a membrane washing step | Je-Dal Jeon, Moon-Hyun Cho, Keun-Ho Lee, In-Seog Chung | 1997-10-14 |