Tae-Min Eom — 7 Patents at Samsung

Tae-Min Eom has been granted 7 US patents while listed as an inventor at Samsung. The first was granted in 2004 and the most recent in March 2012. Tae-Min Eom ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Tae-Min Eom in Seocho-gu, KR.

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Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
8138057	Metal oxide alloy layer, method of forming the metal oxide alloy layer, and methods of manufacturing a gate structure and a capacitor including the metal oxide alloy layer	Jung-Ho Lee, Jung-Sik Choi, Jun-Hyun Cho, Ji Hyun Lee	2012-03-20
7427573	Forming composite metal oxide layer with hafnium oxide and titanium oxide	Jung-Ho Lee, Jung-Sik Choi, Jun-Hyun Cho, Ji Hyun Lee	2008-09-23
7310140	Method and apparatus for inspecting a wafer surface	Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee, Joung Soo Kim, Moon-kyung Kim +2 more	2007-12-18
7186280	Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method	Chung-Sam Jun, Yu-Sin Yang, Yun-Jung Jee	2007-03-06
6927077	Method and apparatus for measuring contamination of a semiconductor substrate	Yu-Sin Yang, Kwan-Woo Ryu, Park-Song Kim, Sang-Mun Chon, Sun-Yong Choi +1 more	2005-08-09
6869215	Method and apparatus for detecting contaminants in ion-implanted wafer	Yu-Sin Yang, Sang-Mun Chon, Sun-Yong Choi, Chung-Sam Jun, Kwan-Woo Ryu +1 more	2005-03-22
6803241	Method of monitoring contact hole of integrated circuit using corona charges	Chung-Sam Jun, Yu-Sin Yang	2004-10-12

Tae-Min Eom — 7 Patents

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