Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7646478 | Apparatus and method for examining spectral characteristics of transmitted light through an object | Dong-Su Ha, Chung-Sam Jun | 2010-01-12 |
| 7601555 | Wafer inspection system and method thereof | Kwang Soo Kim, Seung Min Choi, Yu-han Jeong | 2009-10-13 |
| 7280233 | Method and apparatus for inspecting an edge exposure area of a wafer | Sun-Yong Choi, Chung-Sam Jun, Dong-Chun Lee, Kwang-Jun Yoon | 2007-10-09 |
| 7274471 | Systems and methods for measuring distance of semiconductor patterns | Kwang-Jun Yoon, Sun-Yong Choi, Chung-Sam Jun, Dong-Jin Park | 2007-09-25 |
| 6815236 | Method of measuring a concentration of a material and method of measuring a concentration of a dopant of a semiconductor device | Tae Kyoung Kim, Sun-Yong Choi, Chung-Sam Jun, Kwang Soo Kim, Jeong Hyun Choi +1 more | 2004-11-09 |