Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8551791 | Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis | Jang-Ik Park, Chung-Sam Jun, Ji Hye Kim, Kwan-Woo Ryu, Kong-Jung Sa +1 more | 2013-10-08 |
| 8446583 | Light focusing unit and spectrum measuring apparatus having the same | Hyun Jong Kim, Chung-Sam Jun | 2013-05-21 |
| 7375003 | Methods of manufacturing a semiconductor device | Joo-Byoung Yoon, Jin-Sung Kim, Kyung-Woo Lee, Yeong-Cheol Lee, Sang Jun Park | 2008-05-20 |
| 7355729 | Apparatus and method for measuring a thickness of a substrate | Sun-Yong Choi, Chung-Sam Jun, Kye-Weon Kim | 2008-04-08 |
| 7197426 | Method and apparatus for measuring thickness of metal layer | Jang-Ik Park, Chung-Sam Jun | 2007-03-27 |