Issued Patents All Time
Showing 51–65 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7363441 | Portable storage apparatus and method for freely changing data bus width | Myoung-kyoon Yim | 2008-04-22 |
| 7234031 | Portable storage apparatus and method for freely changing data bus width | Myoung-kyoon Yim | 2007-06-19 |
| 7205543 | Auto focusing apparatus and method | Yong-Wan Kim, Byung-Am Lee, Jin Woo Lee, Hyo Sang Cho | 2007-04-17 |
| 7091485 | Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles | Min-Sub Kang, Kwang-Sik Kim, Kyung-Ho Jung, Sung-Joong Kim | 2006-08-15 |
| 6912056 | Apparatus and method for measuring each thickness of a multilayer stacked on a substrate | Pil-Sik Hyun, Sun-Jin Kang, Kyung-Ho Jung | 2005-06-28 |
| 6870948 | Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image | Chung-Sam Jun, Sang-Mun Chon, Sang-bong Choi, Kye-Weon Kim, Sang Hoon Lee +2 more | 2005-03-22 |
| 6780607 | Method for cell-free protein complete post-translational modification | Cha-Yong Choi, Sang Hyeon Kang, Taek Kang, Ji-Hyoung Woo, Seung Woo CHO | 2004-08-24 |
| 6231918 | Oxide film thickness standards and manufacturing methods thereof | Jung-woo Sun | 2001-05-15 |
| 6150185 | Methods of manufacturing and testing integrated circuit field effect transistors using scanning electron microscope to detect undesired conductive material | Sang Hun Lee, Yong-Ju Kim, Sang-kyu Hahm | 2000-11-21 |
| 6048743 | Using a submicron level dimension reference | Kyoung-mo Yang | 2000-04-11 |
| 6008503 | Oxide film thickness standards | Jung-woo Sun | 1999-12-28 |
| 5953579 | In-line test of contact opening of semiconductor device | Byung-Am Lee, Kyoung-mo Yang | 1999-09-14 |
| 5818285 | Fuse signature circuits for microelectronic devices | Young-Sik Seok | 1998-10-06 |
| 5812475 | Programmable refresh circuits and methods for integrated circuit memory devices | Hyun-Soon Jang | 1998-09-22 |
| 5732029 | Method and circuit for testing memory cells in semiconductor memory device | Yong-Sik Seok | 1998-03-24 |