Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6150185 | Methods of manufacturing and testing integrated circuit field effect transistors using scanning electron microscope to detect undesired conductive material | Sang Hun Lee, Yong-Ju Kim, Sang-Kil Lee | 2000-11-21 |
| 6111637 | Apparatus and method for examining wafers | Young-Ho Lee, Young-Kyu Lim, Byoung-Seol Ahn | 2000-08-29 |
| 5746832 | Apparatus for depositing particles onto a wafer | Seung-Ki Chae, Byung-Seol Ahn, Jong Soo Kim | 1998-05-05 |
| 5654205 | Apparatus and method for depositing particles onto a wafer | Seung-Ki Chae, Byung-Seol Ahn, Jong Soo Kim | 1997-08-05 |