TF

Tomoharu Fujiwara

NI Nikon: 51 patents #36 of 2,493Top 2%
OP Optos Plc: 1 patents #32 of 83Top 40%
📍 Gyōda, JP: #8 of 565 inventorsTop 2%
Overall (All Time): #49,954 of 4,157,543Top 2%
52
Patents All Time

Issued Patents All Time

Showing 26–50 of 52 patents

Patent #TitleCo-InventorsDate
8941812 Exposure method, exposure apparatus, and device manufacturing method Kenichi Shiraishi 2015-01-27
8922754 Immersion exposure apparatus and device fabricating method with two substrate stages and metrology station Yuichi Shibazaki 2014-12-30
8891055 Maintenance method, maintenance device, exposure apparatus, and device manufacturing method Yasufumi Nishii, Kenichi Shiraishi 2014-11-18
8795953 Pattern forming method and method for producing device Toshikazu Umatate, Soichi Owa 2014-08-05
8724077 Exposure apparatus, exposure method, and device manufacturing method Hiroyuki Nagasaka, Kenichi Shiraishi, Soichi Owa, Akihiro Miwa 2014-05-13
8654308 Method for determining exposure condition, exposure method, exposure apparatus, and method for manufacturing device 2014-02-18
8456608 Maintenance method, maintenance device, exposure apparatus, and device manufacturing method Yasufumi Nishii, Kenichi Shiraishi 2013-06-04
8330939 Immersion exposure apparatus and device manufacturing method with a liquid recovery port provided on at least one of a first stage and second stage Yuichi Shibazaki 2012-12-11
8236467 Exposure method, exposure apparatus, and device manufacturing method Kenichi Shiraishi 2012-08-07
8179517 Exposure apparatus and method, maintenance method for exposure apparatus, and device manufacturing method 2012-05-15
8089608 Exposure apparatus, exposure method, and device manufacturing method Hiroyuki Nagasaka, Kenichi Shiraishi, Soichi Owa, Akihiro Miwa 2012-01-03
8064039 Exposure method, exposure apparatus, and device manufacturing method Kenichi Shiraishi, Ryuichi Hoshika 2011-11-22
8040489 Substrate processing method, exposure apparatus, and method for producing device by immersing substrate in second liquid before immersion exposure through first liquid Katsushi Nakano, Masahiko Okumura, Tarou Sugihara, Takeyuki Mizutani 2011-10-18
8018571 Exposure apparatus and exposure method, and device manufacturing method 2011-09-13
7914972 Exposure method and device manufacturing method Hiroyuki Nagasaka 2011-03-29
7804576 Maintenance method, maintenance device, exposure apparatus, and device manufacturing method Yasufumi Nishii, Kenichi Shiraishi 2010-09-28
7705968 Plate member, substrate holding device, exposure apparatus and method, and device manufacturing method Hiroyuki Nagasaka 2010-04-27
6936831 Divided reticles for charged-particle-beam microlithography apparatus, and methods for using same Noriyuki Hirayanagi, Kazuaki Suzuki, Teruaki Okino 2005-08-30
6917048 Methods and devices for controlling blur resulting from the space-charge effect and geometrical aberration in a charged-particle-beam microlithography apparatus Kazuaki Suzuki 2005-07-12
6656663 Microlithographic exposure methods using a segmented reticle defining pattern elements exhibiting reduced incidence of stitching anomalies when imaged on a substrate 2003-12-02
6632722 Fiducial mark bodies for charged-particle-beam (CPB) microlithography, methods for making same, and CPB microlithography apparatus comprising same Noriyuki Hirayanagi 2003-10-14
6570752 Wafer chucks and the like including substrate-adhesion detection and adhesion correction Kenji Morita 2003-05-27
6541779 Charged-particle-beam microlithography apparatus including selectable systems for determining alignment-mark position, and device-fabrication methods utilizing same 2003-04-01
6496350 Electrostatic wafer chucks and charged-particle-beam exposure apparatus comprising same 2002-12-17
6447964 Charged-particle-beam microlithography methods including chip-exposure sequences for reducing thermally induced lateral shift of exposure position on the substrate Teruaki Okino, Noriyuki Hirayanagi 2002-09-10