MK

Mustafa N. Kaynak

Micron: 149 patents #72 of 6,345Top 2%
SS Stmicroelectronics Sa: 5 patents #2,729 of 4,662Top 60%
ST Seagate Technology: 1 patents #2,726 of 4,626Top 60%
📍 San Diego, CA: #148 of 23,606 inventorsTop 1%
🗺 California: #945 of 386,348 inventorsTop 1%
Overall (All Time): #5,829 of 4,157,543Top 1%
154
Patents All Time

Issued Patents All Time

Showing 26–50 of 154 patents

Patent #TitleCo-InventorsDate
11996860 Scaled bit flip thresholds across columns for irregular low density parity check decoding Eyal En Gad, Sivagnanam Parthasarathy, Yoav Weinberg 2024-05-28
11994947 Multi-layer code rate architecture for special event protection with reduced performance penalty Kishore Kumar Muchherla, Huai-Yuan Tseng, Akira Goda, Sivagnanam Parthasarathy, Jonathan S. Parry 2024-05-28
11983067 Adjustment of code rate as function of memory endurance state metric Kishore Kumar Muchherla, Niccolo′ Righetti, Sivagnanam Parthasarathy, Mark A. Helm, James Fitzpatrick +1 more 2024-05-14
11966616 Voltage bin calibration based on a voltage distribution reference voltage Kishore Kumar Muchherla, Devin M. Batutis, Xiangang Luo, Peter Feeley, Sivagnanam Parthasarathy +2 more 2024-04-23
11934266 Memory compaction management in memory devices Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Patrick R. Khayat, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more 2024-03-19
11928347 Managing voltage bin selection for blocks of a memory device Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy +2 more 2024-03-12
11923868 Stall mitigation in iterative decoders Sivagnanam Parthasarathy 2024-03-05
11923867 Iterative decoder with a dynamic maximum stop condition Sivagnanam Parthasarathy 2024-03-05
11915776 Error avoidance based on voltage distribution parameters of block families Michael Sheperek, Kishore Kumar Muchherla, Shane Nowell, Larry J. Koudele 2024-02-27
11901911 Stall detection and mitigation in iterative decoders Sivagnanam Parthasarathy 2024-02-13
11886718 Descrambling of scrambled linear codewords using non-linear scramblers Patrick R. Khayat, Sivagnanam Parthasarathy 2024-01-30
11886336 Managing workload of programming sets of pages to memory device Kishore Kumar Muchherla, Karl D. Schuh, Jiangang Wu, Devin M. Batutis, Xiangang Luo 2024-01-30
11886726 Block family-based error avoidance for memory devices Michael Sheperek, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Peter Feeley +3 more 2024-01-30
11869605 Adjusting pass-through voltage based on threshold voltage shift Kishore Kumar Muchherla, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy 2024-01-09
11868639 Providing recovered data to a new memory cell at a memory sub-system based on an unsuccessful error correction operation Sampath K. Ratnam, Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Shane Nowell +2 more 2024-01-09
11854649 Temperature-compensated time estimate for a block to reach a uniform charge loss state Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Vamsi Pavan Rayaprolu 2023-12-26
11847317 Managing bin placement for block families of a memory device based on trigger metric valves Shane Nowell 2023-12-19
11837291 Voltage offset bin selection by die group for memory devices Vamsi Pavan Rayaprolu, Michael Sheperek, Larry J. Koudele, Shane Nowell 2023-12-05
11837307 Managing error-handling flows in memory devices Kishore Kumar Muchherla, Shane Nowell, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more 2023-12-05
11829245 Multi-layer code rate architecture for copyback between partitions with different code rates Kishore Kumar Muchherla, Sivagnanam Parthasarathy, James Fitzpatrick, Mark A. Helm 2023-11-28
11823722 Determining voltage offsets for memory read operations Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy 2023-11-21
11823748 Voltage bin calibration based on a temporary voltage shift offset Kishore Kumar Muchherla, Karl D. Schuh, Xiangang Luo, Shane Nowell, Devin M. Batutis +4 more 2023-11-21
11797205 Measurement of representative charge loss in a block to determine charge loss state Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Vamsi Pavan Rayaprolu 2023-10-24
11783901 Multi-tier threshold voltage offset bin calibration Kishore Kumar Muchherla, Shane Nowell, Karl D. Schuh, Jiangang Wu, Devin M. Batutis +1 more 2023-10-10
11777522 Bit flipping decoder with dynamic bit flipping criteria Sivagnanam Parthasarathy, Eyal En Gad 2023-10-03