VR

Vamsi Pavan Rayaprolu

Micron: 170 patents #56 of 6,345Top 1%
Overall (All Time): #4,764 of 4,157,543Top 1%
170
Patents All Time

Issued Patents All Time

Showing 25 most recent of 170 patents

Patent #TitleCo-InventorsDate
12430052 Data age and validity-based memory management Ashutosh Malshe, Kishore Kumar Muchherla 2025-09-30
12431205 Adaptive calibration for threshold voltage offset bins Steven Michael Kientz 2025-09-30
12373109 Validating read level voltage in memory devices Jeffrey S. McNeil, Eric N. Lee, Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Patrick R. Khayat +1 more 2025-07-29
12353753 Diagonal page mapping in memory systems Tawalin Opastrakoon, Renato C. Padilla, Michael G. Miller, Christopher M. Smitchger, Gary F. Besinga +1 more 2025-07-08
12353771 Charge loss mitigation throughout memory device lifecycle by proactive window shift Steven Michael Kientz, Ugo Russo 2025-07-08
12340095 Management of error-handling flows in memory devices using probability data structure Aswin Thiruvengadam 2025-06-24
12332742 Memory compaction management in memory devices Mustafa N. Kaynak, Sivagnanam Parthasarathy, Patrick R. Khayat, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more 2025-06-17
12334166 Data integrity checks based on voltage distribution metrics Michael Sheperek, Christopher M. Smitchger 2025-06-17
12307111 Block family-based error avoidance for memory devices Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Bruce A. Liikanen, Peter Feeley +3 more 2025-05-20
12287982 Host data storage scan data retention rating Thomas Lentz 2025-04-29
12272412 Performing selective copyback in memory devices Ashutosh Malshe, Gary F. Besinga, Roy Leonard 2025-04-08
12266420 Temperature-compensated time estimate for a block to reach a uniform charge loss state Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak 2025-04-01
12230315 Model for predicting memory system performance Aswin Thiruvengadam 2025-02-18
12223190 Measurement of representative charge loss in a block to determine charge loss state Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak 2025-02-11
12182013 Memory sub-system write sequence track Karl D. Schuh, Jiangang Wu, Kishore Kumar Muchherla 2024-12-31
12164804 Memory sub-system media management groups Karl D. Schuh, Jiangang Wu, Kishore Kumar Muchherla, Ashutosh Malshe 2024-12-10
12164783 Cross-temperature compensation based on media endurance in memory devices Hyungseok Kim, Sampath K. Ratnam 2024-12-10
12148484 Memory sub-system scan Karl D. Schuh, Jeffrey S. McNeil, Kishore Kumar Muchherla, Ashutosh Malshe, Jiangang Wu 2024-11-19
12131790 Media management operations based on health characteristics of memory cells Ashutosh Malshe, Kishore Kumar Muchherla 2024-10-29
12131795 Adaptive temperature compensation for a memory device Steven Michael Kientz 2024-10-29
12119068 Program continuation strategies after memory device power loss Gary F. Besinga, Steven Michael Kientz, Renato C. Padilla 2024-10-15
12087369 Power state aware scan frequency 2024-09-10
12072762 Error-handling management during copyback operations in memory devices Patrick R. Khayat 2024-08-27
12050777 Adaptive scanning of memory devices with supervised learning Li-Te Chang, Murong Lang, Charles See Yeung Kwong, Seungjune Jeon, Zhenming Zhou 2024-07-30
12040025 Two-sided page scans with calibration feedback Christopher M. Smitchger, Patrick R. Khayat, Hyung Seok Kim, Steven Michael Kientz 2024-07-16