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Data integrity checks based on voltage distribution metrics |
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Two-sided page scans with calibration feedback |
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Scan fragmentation in memory devices |
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Accelerating configuration updates for memory devices |
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Optimized storage charge loss management |
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| 11810631 |
Data integrity checks based on voltage distribution metrics |
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| 11756636 |
Determining threshold values for voltage distribution metrics |
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| 11715531 |
Open block management using storage charge loss margin checking |
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Workload adaptive scans for memory sub-systems |
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Dynamic program-verify voltage adjustment for intra-block storage charge loss uniformity |
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| 11507304 |
Diagonal page mapping in memory systems |
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| 11495309 |
Initiating media management operation using voltage distribution metrics in memory system |
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| 11456051 |
Optimized storage charge loss management |
Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam, Michael G. Miller +2 more |
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| 11393548 |
Workload adaptive scans for memory sub-systems |
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2022-07-19 |
