| 12512857 |
Classification of error rate of data retrieved from memory cells |
Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien |
2025-12-30 |
|
| 12505888 |
Memory device producing metadata characterizing applied read voltage level with respect to voltage distributions |
Dung Viet Nguyen, Sivagnanam Parthasarathy, Zhiwang Chen, Dheeraj Srinivasan |
2025-12-23 |
|
| 12488839 |
Search for an optimized read voltage |
James Fitzpatrick, AbdelHakim S. Alhussien, Sivagnanam Parthasarathy |
2025-12-02 |
|
| 12456502 |
Generating semi-soft bit data during corrective read operations in memory devices |
Phong Xuan Nguyen, Jeffrey S. McNeil, Dung Viet Nguyen, Kishore Kumar Muchherla, James Fitzpatrick |
2025-10-28 |
|
| 12451197 |
Adaptive integrity scan rates in a memory sub-system based on block health metrics |
Vamsi Pavan Rayaprolu, Christopher M. Smitchger, James Fitzpatrick, Sampath K. Ratnam |
2025-10-21 |
|
| 12431202 |
Memory read calibration based on memory device-originated metrics characterizing voltage distributions |
Dung Viet Nguyen, Zhengang Chen, Shantilal Rayshi Doru, Hope Henry |
2025-09-30 |
|
| 12430206 |
Temperature sensor management during error handling operations in a memory sub-system |
Steven Michael Kientz, Hyungseok Kim, Zixiang Loh, Jun Wan |
2025-09-30 |
|
| 12424287 |
Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributions |
Shantilal Rayshi Doru, Steven Michael Kientz, Sampath K. Ratnam, Dung Viet Nguyen |
2025-09-23 |
|
| 12412632 |
Managing compensation for charge coupling and lateral migration in memory devices |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2025-09-09 |
|
| 12373109 |
Validating read level voltage in memory devices |
Jeffrey S. McNeil, Eric N. Lee, Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Kishore Kumar Muchherla +1 more |
2025-07-29 |
|
| 12354670 |
Dynamic adjustment of offset voltages for reading memory cells in a memory device |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2025-07-08 |
|
| 12332742 |
Memory compaction management in memory devices |
Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more |
2025-06-17 |
|
| 12327048 |
Using duplicate data for improving error correction capability |
Jeffrey S. McNeil, Kishore Kumar Muchherla, Sivagnanam Parthasarathy, Sundararajan Sankaranarayanan, Jeremy Binfet +1 more |
2025-06-10 |
|
| 12266420 |
Temperature-compensated time estimate for a block to reach a uniform charge loss state |
Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-04-01 |
|
| 12223190 |
Measurement of representative charge loss in a block to determine charge loss state |
Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-02-11 |
|
| 12217803 |
Determine optimized read voltage via identification of distribution shape of signal and noise characteristics |
AbdelHakim S. Alhussien, James Fitzpatrick, Sivagnanam Parthasarathy |
2025-02-04 |
|
| 12197742 |
Managing error compensation using charge coupling and lateral migration sensitivity |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2025-01-14 |
|
| 12119062 |
Managing compensation for cell-to-cell coupling and lateral migration in memory devices based on a sensitivity metric |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2024-10-15 |
$56,577,000 |
| 12105961 |
Copyback clear command for performing a scan and read in a memory device |
Jeffrey S. McNeil, Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Sead Zildzic, Violante Moschiano +1 more |
2024-10-01 |
$53,330,000 |
| 12087374 |
Managing compensation for cell-to-cell coupling and lateral migration in memory devices using segmentation |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2024-09-10 |
$19,817,000 |
| 12072762 |
Error-handling management during copyback operations in memory devices |
Vamsi Pavan Rayaprolu |
2024-08-27 |
$20,478,000 |
| 12073891 |
Integrated command to calibrate read voltage level |
Eric N. Lee, Violante Moschiano, Jeffrey S. McNeil, James Fitzpatrick, Sivagnanam Parthasarathy +1 more |
2024-08-27 |
$20,478,000 |
| 12073899 |
Track charge loss based on signal and noise characteristics of memory cells collected in calibration operations |
Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien |
2024-08-27 |
$20,478,000 |
| 12067290 |
On-die cross-temperature management for a memory device |
Kishore Kumar Muchherla, Violante Moschiano, Akira Goda, Jeffrey S. McNeil, Jung Sheng Hoei +2 more |
2024-08-20 |
$25,472,000 |
| 12046307 |
Managing program verify voltage offsets for charge coupling and lateral migration compensation in memory devices |
Mustafa N. Kaynak, Sivagnanam Parthasarathy |
2024-07-23 |
$34,395,000 |
