PK

Patrick R. Khayat

Micron: 122 patents #107 of 6,345Top 2%
SS Stmicroelectronics Sa: 3 patents #449 of 1,676Top 30%
📍 San Diego, CA: #196 of 23,606 inventorsTop 1%
🗺 California: #1,449 of 386,348 inventorsTop 1%
Overall (All Time): #9,046 of 4,157,543Top 1%
125
Patents All Time

Issued Patents All Time

Showing 26–50 of 125 patents

Patent #TitleCo-InventorsDate
12007838 Accessing data using error correction operation(s) to reduce latency at a memory sub-system Vamsi Pavan Rayaprolu, Dung Viet Nguyen, Zixiang Loh, Sampath K. Ratnam, Thomas Lentz 2024-06-11
12009040 Detection of an incorrectly located read voltage Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien 2024-06-11
11984172 Read disturb mitigation based on signal and noise characteristics of memory cells collected for read calibration James Fitzpatrick, AbdelHakim S. Alhussien, Sivagnanam Parthasarathy 2024-05-14
11934266 Memory compaction management in memory devices Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Sivagnanam Parthasarathy, Sampath K. Ratnam, Kishore Kumar Muchherla +2 more 2024-03-19
11886718 Descrambling of scrambled linear codewords using non-linear scramblers Sivagnanam Parthasarathy, Mustafa N. Kaynak 2024-01-30
11875846 Optimization of soft bit windows based on signal and noise characteristics of memory cells James Fitzpatrick, Sivagnanam Parthasarathy, AbdelHakim S. Alhussien 2024-01-16
11861233 Using duplicate data for improving error correction capability Jeffrey S. McNeil, Kishore Kumar Muchherla, Sivagnanam Parthasarathy, Sundararajan Sankaranarayanan, Jeremy Binfet +1 more 2024-01-02
11854649 Temperature-compensated time estimate for a block to reach a uniform charge loss state Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu 2023-12-26
11797205 Measurement of representative charge loss in a block to determine charge loss state Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu 2023-10-24
11775217 Adaptive and/or iterative operations in executing a read command to retrieve data from memory cells James Fitzpatrick, Sivagnanam Parthasarathy, AbdelHakim S. Alhussien 2023-10-03
11762599 Self adapting iterative read calibration to retrieve data from memory cells AbdelHakim S. Alhussien, Sivagnanam Parthasarathy, James Fitzpatrick 2023-09-19
11740970 Dynamic adjustment of data integrity operations of a memory system based on error rate classification James Fitzpatrick, AbdelHakim S. Alhussien, Sivagnanam Parthasarathy 2023-08-29
11726719 Compound feature generation in classification of error rate of data retrieved from memory cells Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien 2023-08-15
11714710 Providing data of a memory system based on an adjustable error rate Mustafa N. Kaynak, Larry J. Koudele, Michael Sheperek, Sampath K. Ratnam 2023-08-01
11709734 Error correction with syndrome computation in a memory device Mustafa N. Kaynak, Sivagnanam Parthasarathy 2023-07-25
11676666 Read disturb scan for unprogrammed wordlines Sivagnanam Parthasarathy, Mustafa N. Kaynak 2023-06-13
11670396 Determine bit error count based on signal and noise characteristics centered at an optimized read voltage Sivagnanam Parthasarathy, James Fitzpatrick 2023-06-06
11662905 Memory system performance enhancements using measured signal and noise characteristics of memory cells James Fitzpatrick, Sivagnanam Parthasarathy, AbdelHakim S. Alhussien, Violante Moschiano 2023-05-30
11657886 Intelligent proactive responses to operations to read data from memory cells Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien 2023-05-23
11587638 Read model of memory cells using information generated during read operations James Fitzpatrick, Sivagnanam Parthasarathy, AbdelHakim S. Alhussien 2023-02-21
11587624 Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operations James Fitzpatrick, AbdelHakim S. Alhussien, Sivagnanam Parthasarathy 2023-02-21
11581047 Iterative read calibration enhanced according to patterns of shifts in read voltages James Fitzpatrick, Sivagnanam Parthasarathy, AbdelHakim S. Alhussien 2023-02-14
11562801 Determine signal and noise characteristics centered at an optimized read voltage Sivagnanam Parthasarathy, James Fitzpatrick 2023-01-24
11562793 Read soft bits through boosted modulation following reading hard bits Sivagnanam Parthasarathy, James Fitzpatrick, AbdelHakim S. Alhussien 2023-01-24
11557361 Compute an optimized read voltage James Fitzpatrick, AbdelHakim S. Alhussien, Sivagnanam Parthasarathy 2023-01-17