Issued Patents All Time
Showing 25 most recent of 116 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423013 | Open block family duration limited by temperature variation | Michael Sheperek, Bruce A. Liikanen, Steven Michael Kientz | 2025-09-23 |
| 12424288 | Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution | Bruce A. Liikanen, Michael Sheperek | 2025-09-23 |
| 12417158 | Closing block family based on soft and hard closure criteria | Michael Sheperek, Steven S. Williams | 2025-09-16 |
| 12307111 | Block family-based error avoidance for memory devices | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more | 2025-05-20 |
| 12293099 | Open block family duration limited by time and temperature | Michael Sheperek, Bruce A. Liikanen, Steven Michael Kientz, Kishore Kumar Muchherla | 2025-05-06 |
| 12141443 | Dynamic temperature compensation in a memory component | Bruce A. Liikanen, Steve Kientz | 2024-11-12 |
| 12125539 | Adjustment of a starting voltage corresponding to a program operation in a memory sub-system | Bruce A. Liikanen, Michael Sheperek | 2024-10-22 |
| 12061196 | Method for detection and interpretation of results indicated on a photographed diagnostic test | Alexandra Marie Koudele | 2024-08-13 |
| 12040026 | Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution | Bruce A. Liikanen, Michael Sheperek | 2024-07-16 |
| 12001286 | Memory device with dynamic processing level calibration | Bruce A. Liikanen | 2024-06-04 |
| 11941277 | Combination scan management for block families of a memory device | Shane Nowell, Michael Sheperek, Vamsi Pavan Rayaprolu | 2024-03-26 |
| 11940892 | Closing block family based on soft and hard closure criteria | Michael Sheperek, Steven S. Williams | 2024-03-26 |
| 11934666 | Memory device with dynamic program-verify voltage calibration | Bruce A. Liikanen | 2024-03-19 |
| 11923021 | Selection of read offset values in a memory sub-system based on temperature and time to program levels | Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu | 2024-03-05 |
| 11915776 | Error avoidance based on voltage distribution parameters of block families | Michael Sheperek, Kishore Kumar Muchherla, Shane Nowell, Mustafa N. Kaynak | 2024-02-27 |
| 11908536 | First-pass continuous read level calibration | Michael Sheperek, Bruce A. Liikanen | 2024-02-20 |
| 11886726 | Block family-based error avoidance for memory devices | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more | 2024-01-30 |
| 11853556 | Combining sets of memory blocks in a memory device | Steven Michael Kientz, Shane Nowell, Michael Sheperek, Bruce A. Liikanen | 2023-12-26 |
| 11842061 | Open block family duration limited by temperature variation | Michael Sheperek, Bruce A. Liikanen, Steven Michael Kientz | 2023-12-12 |
| 11837291 | Voltage offset bin selection by die group for memory devices | Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Michael Sheperek, Shane Nowell | 2023-12-05 |
| 11817152 | Generating embedded data in memory cells in a memory sub-system | Bruce A. Liikanen, Michael Sheperek | 2023-11-14 |
| 11789640 | Estimation of read level thresholds using a data structure | Michael Sheperek, Bruce A. Liikanen | 2023-10-17 |
| 11755478 | Block family combination and voltage bin selection | Michael Sheperek, Mustafa N. Kaynak, Shane Nowell | 2023-09-12 |
| 11742027 | Dynamic program erase targeting with bit error rate | Bruce A. Liikanen, Michael Sheperek | 2023-08-29 |
| 11733929 | Memory system with dynamic calibration using a variable adjustment mechanism | Michael Sheperek, Steve Kientz | 2023-08-22 |