| 12482530 |
Tracking and refreshing state metrics in memory sub-systems |
Michael Sheperek, Bruce A. Liikanen |
2025-11-25 |
|
| 12451208 |
Charge loss tracking through targeted bit count |
Pitamber Shukla, Tarun Singh Yadav |
2025-10-21 |
|
| 12430206 |
Temperature sensor management during error handling operations in a memory sub-system |
Hyungseok Kim, Zixiang Loh, Patrick R. Khayat, Jun Wan |
2025-09-30 |
|
| 12431205 |
Adaptive calibration for threshold voltage offset bins |
Vamsi Pavan Rayaprolu |
2025-09-30 |
|
| 12424287 |
Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributions |
Shantilal Rayshi Doru, Patrick R. Khayat, Sampath K. Ratnam, Dung Viet Nguyen |
2025-09-23 |
|
| 12423013 |
Open block family duration limited by temperature variation |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen |
2025-09-23 |
|
| 12353771 |
Charge loss mitigation throughout memory device lifecycle by proactive window shift |
Ugo Russo, Vamsi Pavan Rayaprolu |
2025-07-08 |
|
| 12322473 |
Determining read voltage offset in memory devices |
Robert W. Mason, Pitamber Shukla |
2025-06-03 |
|
| 12307111 |
Block family-based error avoidance for memory devices |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more |
2025-05-20 |
|
| 12293099 |
Open block family duration limited by time and temperature |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen, Kishore Kumar Muchherla |
2025-05-06 |
|
| 12266420 |
Temperature-compensated time estimate for a block to reach a uniform charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-04-01 |
|
| 12223190 |
Measurement of representative charge loss in a block to determine charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2025-02-11 |
|
| 12210759 |
Threshold voltage bin calibration at memory device power up |
Chia-Yu Kuo |
2025-01-28 |
|
| 12131795 |
Adaptive temperature compensation for a memory device |
Vamsi Pavan Rayaprolu |
2024-10-29 |
$30,986,000 |
| 12119068 |
Program continuation strategies after memory device power loss |
Gary F. Besinga, Vamsi Pavan Rayaprolu, Renato C. Padilla |
2024-10-15 |
$56,577,000 |
| 12073866 |
Two-stage voltage calibration upon power-up of memory device |
Chia-Yu Kuo |
2024-08-27 |
$20,478,000 |
| 12057190 |
Determining read voltage offset in memory devices |
Robert W. Mason, Pitamber Shukla |
2024-08-06 |
$38,187,000 |
| 12040025 |
Two-sided page scans with calibration feedback |
Christopher M. Smitchger, Vamsi Pavan Rayaprolu, Patrick R. Khayat, Hyung Seok Kim |
2024-07-16 |
$30,823,000 |
| 11977774 |
Charge loss mitigation throughout memory device lifecycle by proactive window shift |
Ugo Russo, Vamsi Pavan Rayaprolu |
2024-05-07 |
$32,619,000 |
| 11955194 |
Tracking and refreshing state metrics in memory sub-systems |
Michael Sheperek, Bruce A. Liikanen |
2024-04-09 |
$33,276,000 |
| 11922041 |
Threshold voltage bin calibration at memory device power up |
Chia-Yu Kuo |
2024-03-05 |
$17,899,000 |
| 11914890 |
Trim value loading management in a memory sub-system |
Vamsi Pavan Rayaprolu |
2024-02-27 |
$14,682,000 |
| 11886726 |
Block family-based error avoidance for memory devices |
Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more |
2024-01-30 |
$12,191,000 |
| 11886712 |
Die family management on a memory device using block family error avoidance |
— |
2024-01-30 |
$12,191,000 |
| 11862274 |
Determination of state metrics of memory sub-systems following power events |
Michael Sheperek, Bruce A. Liikanen |
2024-01-02 |
$12,628,000 |
