Issued Patents All Time
Showing 25 most recent of 104 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423013 | Open block family duration limited by temperature variation | Larry J. Koudele, Bruce A. Liikanen, Steven Michael Kientz | 2025-09-23 |
| 12424288 | Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution | Bruce A. Liikanen, Larry J. Koudele | 2025-09-23 |
| 12417158 | Closing block family based on soft and hard closure criteria | Larry J. Koudele, Steven S. Williams | 2025-09-16 |
| 12334166 | Data integrity checks based on voltage distribution metrics | Vamsi Pavan Rayaprolu, Christopher M. Smitchger | 2025-06-17 |
| 12307111 | Block family-based error avoidance for memory devices | Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Peter Feeley +3 more | 2025-05-20 |
| 12293099 | Open block family duration limited by time and temperature | Larry J. Koudele, Bruce A. Liikanen, Steven Michael Kientz, Kishore Kumar Muchherla | 2025-05-06 |
| 12125539 | Adjustment of a starting voltage corresponding to a program operation in a memory sub-system | Bruce A. Liikanen, Larry J. Koudele | 2024-10-22 |
| 12040026 | Adjustment of program verify targets corresponding to a last programming distribution and a programming distribution adjacent to an initial programming distribution | Bruce A. Liikanen, Larry J. Koudele | 2024-07-16 |
| 11983065 | Logic based read sample offset in a memory sub-system | Bruce A. Liikanen | 2024-05-14 |
| 11955194 | Tracking and refreshing state metrics in memory sub-systems | Bruce A. Liikanen, Steven Michael Kientz | 2024-04-09 |
| 11941277 | Combination scan management for block families of a memory device | Shane Nowell, Larry J. Koudele, Vamsi Pavan Rayaprolu | 2024-03-26 |
| 11940892 | Closing block family based on soft and hard closure criteria | Larry J. Koudele, Steven S. Williams | 2024-03-26 |
| 11915776 | Error avoidance based on voltage distribution parameters of block families | Kishore Kumar Muchherla, Shane Nowell, Mustafa N. Kaynak, Larry J. Koudele | 2024-02-27 |
| 11908536 | First-pass continuous read level calibration | Larry J. Koudele, Bruce A. Liikanen | 2024-02-20 |
| 11886726 | Block family-based error avoidance for memory devices | Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Peter Feeley +3 more | 2024-01-30 |
| 11862274 | Determination of state metrics of memory sub-systems following power events | Bruce A. Liikanen, Steven Michael Kientz | 2024-01-02 |
| 11853556 | Combining sets of memory blocks in a memory device | Steven Michael Kientz, Larry J. Koudele, Shane Nowell, Bruce A. Liikanen | 2023-12-26 |
| 11842061 | Open block family duration limited by temperature variation | Larry J. Koudele, Bruce A. Liikanen, Steven Michael Kientz | 2023-12-12 |
| 11842772 | Voltage bin boundary calibration at memory device power up | Bruce A. Liikanen, Steve Kientz | 2023-12-12 |
| 11837291 | Voltage offset bin selection by die group for memory devices | Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Larry J. Koudele, Shane Nowell | 2023-12-05 |
| 11817152 | Generating embedded data in memory cells in a memory sub-system | Bruce A. Liikanen, Larry J. Koudele | 2023-11-14 |
| 11810631 | Data integrity checks based on voltage distribution metrics | Vamsi Pavan Rayaprolu, Christopher M. Smitchger | 2023-11-07 |
| 11789640 | Estimation of read level thresholds using a data structure | Larry J. Koudele, Bruce A. Liikanen | 2023-10-17 |
| 11791004 | Threshold voltage offset bin selection based on die family in memory devices | Bruce A. Liikanen, Steve Kientz, Anita Ekren, Gerald L. Cadloni | 2023-10-17 |
| 11768619 | Voltage based combining of block families for memory devices | Kishore Kumar Muchherla, Shane Nowell | 2023-09-26 |