MS

Michael Sheperek

Micron: 101 patents #147 of 6,345Top 3%
TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
WT Western Digital Technologies: 1 patents #1,787 of 3,180Top 60%
📍 Longmont, CO: #7 of 2,039 inventorsTop 1%
🗺 Colorado: #79 of 40,980 inventorsTop 1%
Overall (All Time): #13,396 of 4,157,543Top 1%
104
Patents All Time

Issued Patents All Time

Showing 26–50 of 104 patents

Patent #TitleCo-InventorsDate
11755478 Block family combination and voltage bin selection Larry J. Koudele, Mustafa N. Kaynak, Shane Nowell 2023-09-12
11742027 Dynamic program erase targeting with bit error rate Bruce A. Liikanen, Larry J. Koudele 2023-08-29
11735254 Error avoidance based on voltage distribution parameters of blocks Shane Nowell, Steven Michael Kientz, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele +1 more 2023-08-22
11733929 Memory system with dynamic calibration using a variable adjustment mechanism Larry J. Koudele, Steve Kientz 2023-08-22
11733928 Read sample offset bit determination in a memory sub-system Bruce A. Liikanen 2023-08-22
11733896 Reliability scan assisted voltage bin selection Vamsi Pavan Rayaprolu, Shane Nowell 2023-08-22
11727994 Performing threshold voltage offset bin selection by package for memory devices Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Larry J. Koudele 2023-08-15
11726689 Time-based combining for block families of a memory device Shane Nowell, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-08-15
11721409 Smart sampling for block family scan Vamsi Pavan Rayaprolu, Shane Nowell, Steven Michael Kientz 2023-08-08
11721399 Memory system with dynamic calibration using a trim management mechanism Larry J. Koudele, Steve Kientz 2023-08-08
11714710 Providing data of a memory system based on an adjustable error rate Mustafa N. Kaynak, Larry J. Koudele, Patrick R. Khayat, Sampath K. Ratnam 2023-08-01
11714580 Dynamic background scan optimization in a memory sub-system Gerald L. Cadloni, Francis Chew, Bruce A. Liikanen, Larry J. Koudele 2023-08-01
11709775 Write data for bin resynchronization after power loss Bruce A. Liikanen, Steven Michael Kientz 2023-07-25
11705208 Read level calibration in memory devices using embedded servo cells Larry J. Koudele, Bruce A. Liikanen 2023-07-18
11705193 Error avoidance based on voltage distribution parameters Shane Nowell, Steven Michael Kientz, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele +1 more 2023-07-18
11705192 Managing read level voltage offsets for low threshold voltage offset bin placements Kishore Kumar Muchherla, Mustafa N. Kaynak, Shane Nowell 2023-07-18
11704217 Charge loss scan operation management in memory devices Steven Michael Kientz, Shane Nowell, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele 2023-07-18
11675511 Associating multiple cursors with block family of memory device Bruce A. Liikanen, Peter Feeley, Larry J. Koudele, Shane Nowell, Steven Michael Kientz 2023-06-13
11675509 Multiple open block families supporting multiple cursors of a memory device Shane Nowell, Larry J. Koudele, Bruce A. Liikanen, Steve Kientz 2023-06-13
11669380 Dynamic programming of page margins Larry J. Koudele, Bruce A. Liikanen 2023-06-06
11664080 Bin placement according to program-erase cycles Mustafa N. Kaynak, Steven Michael Kientz 2023-05-30
11651828 First-pass dynamic program targeting (DPT) Larry J. Koudele, Bruce A. Liikanen 2023-05-16
11636913 Tracking and refreshing state metrics in memory sub-systems Bruce A. Liikanen, Steven Michael Kientz 2023-04-25
11625177 Combination scan management for block families of a memory device Shane Nowell, Larry J. Koudele, Vamsi Pavan Rayaprolu 2023-04-11
11609706 Read sample offset placement Bruce A. Liikanen, Larry J. Koudele 2023-03-21