AT

Aswin Thiruvengadam

Micron: 46 patents #399 of 6,345Top 7%
Overall (All Time): #59,434 of 4,157,543Top 2%
47
Patents All Time

Issued Patents All Time

Showing 25 most recent of 47 patents

Patent #TitleCo-InventorsDate
12367942 Trim setting determination for a memory device Daniel L. Lowrance, Peter Feeley 2025-07-22
12340095 Management of error-handling flows in memory devices using probability data structure Vamsi Pavan Rayaprolu 2025-06-24
12230315 Model for predicting memory system performance Vamsi Pavan Rayaprolu 2025-02-18
12181940 Temperature control component for electronic systems wherein a thermal transfer component is tappered Daniel G. Scobee, Aleksandr Semenuk 2024-12-31
12032833 Management of error-handling flows in memory devices using probability data structure Vamsi Pavan Rayaprolu 2024-07-09
11853207 Configurable trim settings on a memory device Daniel L. Lowrance, Peter Feeley 2023-12-26
11854634 Selectable trim settings on a memory device Daniel L. Lowrance, Peter Feeley 2023-12-26
11836078 Trim setting determination on a memory device Daniel L. Lowrance, Peter Feeley 2023-12-05
11817164 Trim setting determination for a memory device Daniel L. Lowrance, Peter Feeley 2023-11-14
11808803 Standalone thermal chamber for a temperature control component Daniel G. Scobee, Aleksandr Semenuk 2023-11-07
11808806 Allocation of test resources to perform a test of memory components Sivagnanam Parthasarathy, Frederick Jensen 2023-11-07
11783185 Analysis of memory sub-systems based on threshold distributions Daniel L. Lowrance, Joshua Phelps, Peter B. Harrington 2023-10-10
D995530 Thermal control component Daniel G. Scobee, Aleksandr Semenuk 2023-08-15
11658175 Thermal chamber for a thermal control component Daniel G. Scobee, Aleksandr Semenuk 2023-05-23
11493550 Standalone thermal chamber for a temperature control component Daniel G. Scobee, Aleksandr Semenuk 2022-11-08
D954712 Thermal control component Daniel G. Scobee, Aleksandr Semenuk 2022-06-14
11334129 Temperature control component for electronic systems Daniel G. Scobee, Aleksandr Semenuk 2022-05-17
11295209 Analysis of memory sub-systems based on threshold distributions Daniel L. Lowrance, Joshua Phelps, Peter B. Harrington 2022-04-05
11264112 Trim setting determination for a memory device Daniel L. Lowrance, Peter Feeley 2022-03-01
11257565 Management of test resources to perform testing of memory components under different temperature conditions Sivagnanam Parthasarathy, Daniel G. Scobee, Frederick Jensen 2022-02-22
11226896 Trim setting determination on a memory device Daniel L. Lowrance, Peter Feeley 2022-01-18
11131705 Allocation of test resources to perform a test of memory components Sivagnanam Parthasarathy, Frederick Jensen 2021-09-28
11121125 Thermal chamber for a thermal control component Daniel G. Scobee, Aleksandr Semenuk 2021-09-14
11101015 Multi-dimensional usage space testing of memory components Sivagnanam Parthasarathy, Preston A. Thomson 2021-08-24
11043269 Performing a test of memory components with fault tolerance Sivagnanam Parthasarathy, Daniel G. Scobee 2021-06-22