MK

Mustafa N. Kaynak

Micron: 149 patents #72 of 6,345Top 2%
SS Stmicroelectronics Sa: 5 patents #2,729 of 4,662Top 60%
ST Seagate Technology: 1 patents #2,726 of 4,626Top 60%
📍 San Diego, CA: #148 of 23,606 inventorsTop 1%
🗺 California: #945 of 386,348 inventorsTop 1%
Overall (All Time): #5,829 of 4,157,543Top 1%
154
Patents All Time

Issued Patents All Time

Showing 51–75 of 154 patents

Patent #TitleCo-InventorsDate
11755478 Block family combination and voltage bin selection Michael Sheperek, Larry J. Koudele, Shane Nowell 2023-09-12
11748013 Grouping blocks based on power cycle and power on time Kishore Kumar Muchherla, Jiangang Wu, Sampath K. Ratnam, Sivagnanam Parthasarathy, Peter Feeley +1 more 2023-09-05
11735254 Error avoidance based on voltage distribution parameters of blocks Shane Nowell, Steven Michael Kientz, Michael Sheperek, Kishore Kumar Muchherla, Larry J. Koudele +1 more 2023-08-22
11727994 Performing threshold voltage offset bin selection by package for memory devices Michael Sheperek, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu, Bruce A. Liikanen, Larry J. Koudele 2023-08-15
11722151 Bit flipping decoder based on soft information Sivagnanam Parthasarathy 2023-08-08
11720286 Extended cross-temperature handling in a memory sub-system Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Shane Nowell +2 more 2023-08-08
11714710 Providing data of a memory system based on an adjustable error rate Larry J. Koudele, Michael Sheperek, Patrick R. Khayat, Sampath K. Ratnam 2023-08-01
11711095 Bit flipping low-density parity-check decoders with low error floor Sivagnanam Parthasarathy 2023-07-25
11710527 Mitigating a voltage condition of a memory cell in a memory sub-system Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy +2 more 2023-07-25
11709734 Error correction with syndrome computation in a memory device Patrick R. Khayat, Sivagnanam Parthasarathy 2023-07-25
11709727 Managing error-handling flows in memory devices Kishore Kumar Muchherla, Shane Nowell, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more 2023-07-25
11705925 Dynamic bit flipping order for iterative error correction Sivagnanam Parthasarathy 2023-07-18
11705193 Error avoidance based on voltage distribution parameters Shane Nowell, Steven Michael Kientz, Michael Sheperek, Kishore Kumar Muchherla, Larry J. Koudele +1 more 2023-07-18
11705192 Managing read level voltage offsets for low threshold voltage offset bin placements Kishore Kumar Muchherla, Michael Sheperek, Shane Nowell 2023-07-18
11704217 Charge loss scan operation management in memory devices Michael Sheperek, Steven Michael Kientz, Shane Nowell, Kishore Kumar Muchherla, Larry J. Koudele 2023-07-18
11689217 Methods and systems of stall mitigation in iterative decoders Sivagnanam Parthasarathy 2023-06-27
11676666 Read disturb scan for unprogrammed wordlines Sivagnanam Parthasarathy, Patrick R. Khayat 2023-06-13
11676664 Voltage bin selection for blocks of a memory device after power up of the memory device Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy, Karl D. Schuh +2 more 2023-06-13
11675529 Threshold voltage determination for calibrating voltage bins of a memory device Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy 2023-06-13
11664080 Bin placement according to program-erase cycles Michael Sheperek, Steven Michael Kientz 2023-05-30
11620074 Voltage bin calibration based on a voltage distribution reference voltage Kishore Kumar Muchherla, Devin M. Batutis, Xiangang Luo, Peter Feeley, Sivagnanam Parthasarathy +2 more 2023-04-04
11609846 Managing workload of programming sets of pages to memory device Kishore Kumar Muchherla, Karl D. Schuh, Jiangang Wu, Devin M. Batutis, Xiangang Luo 2023-03-21
11593005 Managing voltage bin selection for blocks of a memory device Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy +2 more 2023-02-28
11587639 Voltage calibration scans to reduce memory device overhead Kishore Kumar Muchherla, Sivagnanam Parthasarathy, Xiangang Luo, Peter Feeley, Devin M. Batutis +4 more 2023-02-21
11587627 Determining voltage offsets for memory read operations Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy 2023-02-21