MK

Mustafa N. Kaynak

Micron: 149 patents #72 of 6,345Top 2%
SS Stmicroelectronics Sa: 5 patents #2,729 of 4,662Top 60%
ST Seagate Technology: 1 patents #2,726 of 4,626Top 60%
📍 San Diego, CA: #148 of 23,606 inventorsTop 1%
🗺 California: #945 of 386,348 inventorsTop 1%
Overall (All Time): #5,829 of 4,157,543Top 1%
154
Patents All Time

Issued Patents All Time

Showing 76–100 of 154 patents

Patent #TitleCo-InventorsDate
11556417 Reduction of errors in data retrieved from a memory device to apply an error correction code of a predetermined code rate Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Akira Goda 2023-01-17
11532373 Managing error-handling flows in memory devices Kishore Kumar Muchherla, Shane Nowell, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more 2022-12-20
11514989 Dynamic adjustment of offset voltages for reading memory cells in a memory device Sivagnanam Parthasarathy, Patrick R. Khayat 2022-11-29
11500564 Grouping blocks based on power cycle and power on time Kishore Kumar Muchherla, Jiangang Wu, Sampath K. Ratnam, Sivagnanam Parthasarathy, Peter Feeley +1 more 2022-11-15
11463112 Dynamic bit flipping order for iterative error correction Sivagnanam Parthasarathy 2022-10-04
11462280 Adjusting pass-through voltage based on threshold voltage shift Kishore Kumar Muchherla, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy 2022-10-04
11450391 Multi-tier threshold voltage offset bin calibration Kishore Kumar Muchherla, Shane Nowell, Karl D. Schuh, Jiangang Wu, Devin M. Batutis +1 more 2022-09-20
11450382 Memory cell state in a valley between adjacent data states Sivagnanam Parthasarathy, Patrick R. Khayat, Robert B. Eisenhuth 2022-09-20
11443830 Error avoidance based on voltage distribution parameters of block families Michael Sheperek, Kishore Kumar Muchherla, Shane Nowell, Larry J. Koudele 2022-09-13
11437108 Voltage bin calibration based on a temporary voltage shift offset Kishore Kumar Muchherla, Karl D. Schuh, Xiangang Luo, Shane Nowell, Devin M. Batutis +4 more 2022-09-06
11429309 Adjusting a parameter for a programming operation based on the temperature of a memory system Sampath K. Ratnam, Zixiang Loh, Nagendra Prasad Ganesh Rao, Larry K Koudele, Vamsi Pavan Rayaprolu +2 more 2022-08-30
11431355 Error correction code (ECC) operations in memory for providing redundant error correction Patrick R. Khayat, Sivagnanam Parthasarathy 2022-08-30
11422885 Tiered error correction code (ECC) operations in memory Patrick R. Khayat, Sivagnanam Parthasarathy 2022-08-23
11410734 Voltage bin selection for blocks of a memory device after power up of the memory device Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy, Karl D. Schuh +2 more 2022-08-09
11405058 Stopping criteria for layered iterative error correction William H. Radke, Patrick R. Khayat, Sivagnanam Parthasarathy 2022-08-02
11398835 Managing defective bitline locations in a bit flipping decoder Sivagnanam Parthasarathy 2022-07-26
11393541 Mitigating a voltage condition of a memory cell in a memory sub-system Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy +2 more 2022-07-19
11394403 Error correction based on rate adaptive low density parity check (LDPC) codes with flexible column weights in the parity check matrices Eyal En Gad, Sivagnanam Parthasarathy, Zhengang Chen, Yoav Weinberg 2022-07-19
11372545 Managing bin placement for block families of a memory device based on trigger metric values Shane Nowell 2022-06-28
11360677 Selective partitioning of sets of pages programmed to memory device Kishore Kumar Muchherla, Karl D. Schuh, Jiangang Wu, Devin M. Batutis, Xiangang Luo 2022-06-14
11349498 Bit flipping low-density parity-check decoders with low error floor Sivagnanam Parthasarathy 2022-05-31
11334413 Estimating an error rate associated with memory Sivagnanam Parthasarathy, Patrick R. Khayat, Nicholas J. Richardson 2022-05-17
11275515 Descrambling of scrambled linear codewords using non-linear scramblers Patrick R. Khayat, Sivagnanam Parthasarathy 2022-03-15
11270772 Voltage offset bin selection by die group for memory devices Vamsi Pavan Rayaprolu, Michael Sheperek, Larry J. Koudele, Shane Nowell 2022-03-08
11263134 Block family combination and voltage bin selection Michael Sheperek, Larry J. Koudele, Shane Nowell 2022-03-01