Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11976301 | Method for producing culture containing megakaryocytes, and method for producing platelets using same | Takeaki Dohda, Koji Eto, Hiroshi Endo, Sou Nakamura | 2024-05-07 |
| 11762285 | Template, patterning method, and method for manufacturing semiconductor device | Anupam Mitra, Masaki Mitsuyasu, Kazuya Fukuhara, Kazuhiro Takahata | 2023-09-19 |
| 10754246 | Sliding inhibition portion extracting method, pattern forming method, and semiconductor device manufacturing method | — | 2020-08-25 |
| 10592401 | Human machine blur testing method | PATRICK HANSLITS, DAVID LYON, GARY L. BRADDOCK, NARAYANI MITAL | 2020-03-17 |
| 10040219 | Mold and mold manufacturing method | Yoko Takekawa, Ryouichi Inanami, Masafumi Asano, Kazuhiro Takahata, Shigeki Nojima +3 more | 2018-08-07 |
| 9971342 | Pattern data creating method, template, and semiconductor device manufacturing method | Mitsuko Shimizu | 2018-05-15 |
| 9836142 | Capacitive rotary encoder | Larry V. Craig | 2017-12-05 |
| 9557872 | Capacitive rotary encoder | Larry V. Craig | 2017-01-31 |
| 9158422 | Capacitive rotary encoder | Larry V. Craig | 2015-10-13 |
| 8443310 | Pattern correcting method, mask forming method, and method of manufacturing semiconductor device | Masanari Kajiwara, Toshiya Kotani, Hiromitsu Mashita, Fumiharu Nakajima | 2013-05-14 |
| 8261217 | Pattern forming method and pattern verifying method | — | 2012-09-04 |
| 8230379 | Layout generating method for semiconductor integrated circuits | Suigen Kyoh | 2012-07-24 |
| 7996794 | Mask data processing method for optimizing hierarchical structure | Toshiya Kotani, Shinichiroh Ohki, Hirotaka Ichikawa | 2011-08-09 |
| 7917871 | Method and program for pattern data generation using a modification guide | Suigen Kyoh, Shimon Maeda | 2011-03-29 |
| 7530049 | Mask manufacturing system, mask data creating method and manufacturing method of semiconductor device | Toshiya Kotani | 2009-05-05 |
| 7418694 | Method for generating test patterns utilized in manufacturing semiconductor device | Atsuhiko Ikeuchi | 2008-08-26 |
| 7065739 | Pattern correction method of semiconductor device | Toshiya Kotani, Satoshi Tanaka, Susumu Watanabe, Mitsuhiro Yano | 2006-06-20 |
| 6964031 | Mask pattern generating method and manufacturing method of semiconductor apparatus | Toshiya Kotani, Satoshi Tanaka, Soichi Inoue, Hirotaka Ichiakwa | 2005-11-08 |
| 6907596 | Mask data generating apparatus, a computer implemented method for generating mask data and a computer program for controlling the mask data generating apparatus | Toshiya Kotani, Satoshi Tanaka, Susumu Watanabe | 2005-06-14 |
| 6622297 | Pattern correcting method and pattern verifying method | Taiga Uno, Kazuko Yamamoto, Satoshi Tanaka | 2003-09-16 |
| 6243855 | Mask data design method | Taiga Uno, Kazuko Yamamoto, Koji Hashimoto | 2001-06-05 |
| 6110647 | Method of manufacturing semiconductor device | Soichi Inoue, Hisashi Kaneko, Masahiko Hasunuma, Takamasa Usui, Masami Aoki +1 more | 2000-08-29 |
| 6060368 | Mask pattern correction method | Koji Hashimoto, Hisako Aoyama, Soichi Inoue, Kazuko Yamamoto | 2000-05-09 |
| 6004701 | Method for designing Levenson photomask | Taiga Uno, Kiyomi Koyama, Kazuko Yamamoto, Satoshi Tanaka, Koji Hashimoto | 1999-12-21 |