UU

Upendra Ummethala

Applied Materials: 23 patents #544 of 7,310Top 8%
BO Bose: 6 patents #270 of 1,083Top 25%
KL Kla-Tencor: 3 patents #442 of 1,394Top 35%
CI Clearmotion Acquisition I: 2 patents #9 of 26Top 35%
MA Maxtor: 1 patents #329 of 656Top 55%
Overall (All Time): #95,280 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 25 most recent of 35 patents

Patent #TitleCo-InventorsDate
12432461 Smart camera substrate Philip Allan Kraus, Keith R. Berding, Blake Erickson, Patrick Tae, Devendra Channappa Holeyannavar +4 more 2025-09-30
12283503 Substrate measurement subsystem Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel, Zhaozhao Zhu 2025-04-22
12211670 Performing radio frequency matching control using a model-based digital twin Tao Zhang 2025-01-28
12191176 Integrated substrate measurement system to improve manufacturing process performance Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel, Zhaozhao Zhu 2025-01-07
12114083 Smart camera substrate Philip Allan Kraus, Keith R. Berding, Blake Erickson, Patrick Tae, Devendra Channappa Holeyannavar +4 more 2024-10-08
12066639 Adjustable achromatic collimator assembly for endpoint detection systems Pengyu Han, John Anthony O'MALLEY, III, Michael N. Grimbergen, Lei Lian, Michael Kutney 2024-08-20
11808746 Concentration sensor for precursor delivery system Vivek Shah, Varoujan Chakarian 2023-11-07
11784028 Performing radio frequency matching control using a model-based digital twin Tao Zhang 2023-10-10
11736818 Smart camera substrate Philip Allan Kraus, Keith R. Berding, Blake Erickson, Patrick Tae, Devendra Channappa Holeyannavar +4 more 2023-08-22
11735401 In-situ optical chamber surface and process sensor Chuang-Chia Lin, Steven E. Babayan, Lei Lian 2023-08-22
11719952 Adjustable achromatic collimator assembly for endpoint detection systems Pengyu Han, John Anthony O'MALLEY, III, Michael N. Grimbergen, Lei Lian, Michael Kutney 2023-08-08
11693053 Bode fingerprinting for characterizations and failure detections in processing chamber Tao Zhang, Ajit Balakrishna 2023-07-04
11688616 Integrated substrate measurement system to improve manufacturing process performance Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel, Zhaozhao Zhu 2023-06-27
D977504 Portion of a display panel with a graphical user interface Blake Erickson, Prashanth Kumar, Michael Kutney, Steven Trey Tindel, Zhaozhao Zhu 2023-02-07
11499869 Optical wall and process sensor with plasma facing sensor Chuang-Chia Lin 2022-11-15
11486927 Bode fingerprinting for characterizations and failure detections in processing chamber Tao Zhang, Ajit Balakrishna 2022-11-01
11346875 Micro resonator array sensor for detecting wafer processing parameters Chuang-Chia Lin 2022-05-31
11289387 Methods and apparatus for backside via reveal processing Prayudi Lianto, Sik Hin Chi, SHIH-CHAO HUNG, Pin Gian Gan, Ricardo Fujii Vinluan +10 more 2022-03-29
11284018 Smart camera substrate Philip Allan Kraus, Keith R. Berding, Blake Erickson, Patrick Tae, Devendra Channappa Holeyannavar +4 more 2022-03-22
11209398 High quality factor embedded resonator wafers Chuang-Chia Lin, Surajit Kumar 2021-12-28
11114286 In-situ optical chamber surface and process sensor Chuang-Chia Lin, Steven E. Babayan, Lei Lian 2021-09-07
11009538 Micro resonator array system Chuang-Chia Lin, Andrew Kunil Choe 2021-05-18
10901021 Method for detecting wafer processing parameters with micro resonator array sensors Chuang-Chia Lin 2021-01-26
10663482 Accelerometer leveling in an actively controlled vehicle suspension David J. Warkentin 2020-05-26
9952253 Accelerometer leveling in an actively controlled vehicle suspension David J. Warkentin 2018-04-24