Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283766 | Connector and flat cable | Chengfu Chen, Akira Ieyama | 2025-04-22 |
| 11840390 | Container | Kohhei Nanbu, Yuya YANO, Akira Ieyama | 2023-12-12 |
| 9390490 | Method and device for testing defect using SEM | Yuji Takagi, Minoru Harada, Ryo Nakagaki, Toshifumi Honda, Takehiro Hirai | 2016-07-12 |
| 9311697 | Inspection method and device therefor | Minoru Harada, Ryo Nakagaki, Takehiro Hirai | 2016-04-12 |
| 9291604 | Method for measurement of vibration property of structure, and vibration property measurement device | Itsuro Kajiwara | 2016-03-22 |
| 9057873 | Global alignment using multiple alignment pattern candidates | Atsushi Miyamoto, Toshikazu Kawahara, Akihiro Onizawa | 2015-06-16 |
| 8853628 | Defect inspection method, and device thereof | Toshifumi Honda, Takashi Hiroi | 2014-10-07 |
| 8730318 | Inspection apparatus and method for producing image for inspection | Kenji Nakahira, Atsushi Miyamoto, Minoru Yoshida | 2014-05-20 |
| 8509516 | Circuit pattern examining apparatus and circuit pattern examining method | Takashi Hiroi, Takeyuki Yoshida, Toshifumi Honda | 2013-08-13 |
| 8121395 | Inspection apparatus and an inspection method for inspecting a circuit pattern | Takashi Hiroi, Takeyuki Yoshida, Toshifumi Honda | 2012-02-21 |
| 8111902 | Method and apparatus for inspecting defects of circuit patterns | Takashi Hiroi, Hirohito Okuda, Koichi Hayakawa, Fumihiko Fukunaga | 2012-02-07 |
| 6870169 | Method and apparatus for analyzing composition of defects | Kenji Obara, Yuji Takagi, Hisae Shibuya | 2005-03-22 |
| 6792366 | Method and apparatus for inspecting defects in a semiconductor wafer | Yuuji Takagi, Hisae Shibuya, Kenji Obara | 2004-09-14 |
| 6792367 | Method and apparatus for inspecting defects in a semiconductor wafer | Yuuji Takagi, Hisae Shibuya, Kenji Obara | 2004-09-14 |
| 6029635 | Fuel vapor emission preventing system | Hidetoshi Sekine, Katsuyuki Ichinohe, Yasufumi Suzuki, Yoshiaki Oyamada | 2000-02-29 |
| 4890307 | Input circuit of charge transfer device | Shin-ichi Imai | 1989-12-26 |
| 4800579 | Charge transfer device provided with charge detection circuit of a floating gate system | Shin-ichi Imai | 1989-01-24 |