IL

Ivan Lazic

FE Fei: 12 patents #41 of 681Top 7%
Overall (All Time): #412,921 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11211223 System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy Stefano Vespucci, Eric Gerardus Theodoor Bosch, Bert Henning Freitag 2021-12-28
10699872 Discriminative imaging technique in scanning transmission charged particle microscopy Eric Gerardus Theodoor Bosch, Robert Imlau 2020-06-30
10665419 Intelligent pre-scan in scanning transmission charged particle microscopy Erik Franken, Bart Jozef Janssen 2020-05-26
10607811 Multi-beam scanning transmission charged particle microscope Ali Mohammadi-Gheidari, Eric Gerardus Theodoor Bosch, Gerard Nicolaas Anne van Veen 2020-03-31
10573488 Method of performing tomographic imaging in a charged-particle microscope Eric Gerardus Theodoor Bosch 2020-02-25
10446366 Imaging technique in scanning transmission charged particle microscopy Eric Gerardus Theodoor Bosch 2019-10-15
10403469 Method of performing tomographic imaging in a charged-particle microscope Eric Gerardus Theodoor Bosch 2019-09-03
9959639 Method of ptychographic imaging Eric Gerardus Theodoor Bosch 2018-05-01
9312098 Method of examining a sample in a charged-particle microscope Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar 2016-04-12
9202670 Method of investigating the wavefront of a charged-particle beam Bart Jozef Janssen, Gijs van Duinen, Uwe Luecken, Ross Savage, Stephanus H.L. van den Boom 2015-12-01
9136087 Method of investigating and correcting aberrations in a charged-particle lens system Gijs van Duinen, Peter Christiaan Tiemeijer 2015-09-15
8766214 Method of preparing and imaging a lamella in a particle-optical apparatus Brian Roberts Routh, Jr., Peter Christiaan Tiemeijer, Bart Jozef Janssen, Thomas G. Miller, David Foord 2014-07-01