BK

Bernardo Kastrup

AB Asml Netherlands B.V.: 10 patents #458 of 3,192Top 15%
AN Asml Holding N.V.: 1 patents #312 of 520Top 60%
Overall (All Time): #487,090 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
12067340 Computational wafer inspection Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more 2024-08-20
11875966 Method and apparatus for inspection Johannes Catharinus Hubertus Mulkens, Marinus Aart Van Den Brink, Jozef Petrus Henricus Benschop, Erwin Paul SMAKMAN, Tamara Druzhinina +1 more 2024-01-16
11094502 Method and apparatus for inspection Johannes Catharinus Hubertus Mulkens, Marinus Aart Van Den Brink, Jozef Petrus Henricus Benschop, Erwin Paul SMAKMAN, Tamara Druzhinina +1 more 2021-08-17
11080459 Computational wafer inspection Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more 2021-08-03
10915689 Method and apparatus to correct for patterning process error Peter Ten Berge, Everhardus Cornelis Mos, Richard Johannes Franciscus Van Haren, Peter Hanzen Wardenier, Erik Weber Jensen +5 more 2021-02-09
10579772 Computational wafer inspection Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more 2020-03-03
9990462 Computational wafer inspection Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more 2018-06-05
9507907 Computational wafer inspection Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more 2016-11-29
9229336 Lithographic apparatus and methods for determining an improved configuration of a lithographic apparatus Jozef Maria Finders, Sander De Putter 2016-01-05
8259285 Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data Kars Zeger Troost, Jason Hintersteiner, Patricius Aloysius Jacobus Tinnemans, Wenceslao A. Cebuhar, Ronald Peter Albright 2012-09-04