WC

Wenceslao A. Cebuhar

AN Asml Holding N.V.: 19 patents #16 of 520Top 4%
AB Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
📍 Norwalk, CT: #34 of 720 inventorsTop 5%
🗺 Connecticut: #2,139 of 34,797 inventorsTop 7%
Overall (All Time): #240,925 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
8259285 Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data Kars Zeger Troost, Jason Hintersteiner, Patricius Aloysius Jacobus Tinnemans, Ronald Peter Albright, Bernardo Kastrup 2012-09-04
7936445 Altering pattern data based on measured optical element characteristics Jason Hintersteiner, Patricius Aloysius Jacobus Tinnemans 2011-05-03
7859735 Systems and methods for minimizing scattered light in multi-SLM maskless lithography Jason Hintersteiner, Stan Janik, Yuli Vladimirsky 2010-12-28
7773199 Methods and systems to compensate for a stitching disturbance of a printed pattern Arno Jan Bleeker, Justin Kreuzer, Azat Latypov, Yuli Vladimirsky 2010-08-10
7688423 Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system not utilizing overlap of the exposure zones Arno Jan Bleeker, Azat Latypov 2010-03-30
7630054 Methods and systems to compensate for a stitching disturbance of a printed pattern Arno Jan Bleeker, Justin Kreuzer, Azat Latypov, Yuli Vladimirsky 2009-12-08
7567368 Systems and methods for minimizing scattered light in multi-SLM maskless lithography Jason Hintersteiner, Stan Janik, Yuli Vladimirsky 2009-07-28
7542013 System and method for imaging enhancement via calculation of a customized optimal pupil field and illumination mode Azat Latypov, Jason Hintersteiner 2009-06-02
7469058 Method and system for a maskless lithography rasterization technique based on global optimization Azat Latypov, Sherman K. Poultney 2008-12-23
7463402 Using time and/or power modulation to achieve dose gray-scale in optical maskless lithography Jason Hintersteiner, Azat Latypov, Gerald Volpe 2008-12-09
7410736 Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system not utilizing overlap of the exposure zones Arno Jan Bleeker, Azat Latypov 2008-08-12
7403266 Maskless lithography systems and methods utilizing spatial light modulator arrays Arno Jan Bleeker, Jason Hintersteiner, Andrew W. McCullough, Solomon Wasserman, Karel Diederick Van Der Mast 2008-07-22
7158307 Efficiently illuminating a modulating device Scott Coston, Jason Hintersteiner 2007-01-02
7133121 Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap of exposure zones with attenuation of the aerial image in the overlap region Arno Jan Bleeker, Justin Kreuzer, Azat Latypov, Yuli Vladimirsky 2006-11-07
7061591 Maskless lithography systems and methods utilizing spatial light modulator arrays Arno Jan Bleeker, Jason Hintersteiner 2006-06-13
7006295 Illumination system and method for efficiently illuminating a pattern generator Scott Coston, Jason Hintersteiner 2006-02-28
6985280 Using time and/or power modulation to achieve dose gray-scaling in optical maskless lithography Jason Hintersteiner, Azat Latypov, Gerald Volpe 2006-01-10
6876440 METHODS AND SYSTEMS TO COMPENSATE FOR A STITCHING DISTURBANCE OF A PRINTED PATTERN IN A MASKLESS LITHOGRAPHY SYSTEM UTILIZING OVERLAP OF EXPOSURE ZONES WITH ATTENUATION OF THE AERIAL IMAGE IN THE OVERLAP REGION Arno Jan Bleeker, Justin Kreuzer, Azat Latypov, Yuli Vladimirsky 2005-04-05
6831768 Using time and/or power modulation to achieve dose gray-scaling in optical maskless lithography Jason Hintersteiner, Azat Latypov, Gerald Volpe 2004-12-14