AM

Andrew W. McCullough

SS Svg Lithography Systems: 11 patents #1 of 30Top 4%
AN Asml Holding N.V.: 9 patents #59 of 520Top 15%
SL Shipley Company, L.L.C.: 1 patents #226 of 401Top 60%
📍 Watertown, MA: #53 of 1,634 inventorsTop 4%
🗺 Massachusetts: #4,617 of 88,656 inventorsTop 6%
Overall (All Time): #186,297 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
7403266 Maskless lithography systems and methods utilizing spatial light modulator arrays Arno Jan Bleeker, Wenceslao A. Cebuhar, Jason Hintersteiner, Solomon Wasserman, Karel Diederick Van Der Mast 2008-07-22
7105836 Method and apparatus for cooling a reticle during lithographic exposure Santiago del Puerto, Daniel N. Galburt, Stephen Roux, Joost Jeroen Ottens 2006-09-12
7092070 Illumination system with spatially controllable partial coherence compensating for line width variances Gregg M. Gallatin 2006-08-15
7029804 Non absorbing reticle and method of making same 2006-04-18
7014963 Non absorbing reticle and method of making same 2006-03-21
6967713 Use of multiple reticles in lithographic printing tools Christopher Mason, Louis John Markoya, Harry Sewell 2005-11-22
6822728 Illumination system with spatially controllable partial coherence compensation for line width variances in a photolithographic system Gregg M. Gallatin 2004-11-23
6800408 Use of multiple reticles in lithographic printing tools Christopher Mason, Luis Markoya, Harry Sewell 2004-10-05
6686101 Non absorbing reticle and method of making same 2004-02-03
6628370 Illumination system with spatially controllable partial coherence compensating for line width variances in a photolithographic system Gregg M. Gallatin 2003-09-30
6628372 Use of multiple reticles in lithographic printing tools Christopher Mason, Louis John Markoya, Harry Sewell 2003-09-30
6445439 EUV reticle thermal management 2002-09-03
6444372 Non absorbing reticle and method of making same 2002-09-03
6292255 Dose correction for along scan linewidth variation 2001-09-18
6259513 Illumination system with spatially controllable partial coherence Gregg M. Gallatin 2001-07-10
6097474 Dynamically adjustable high resolution adjustable slit Pradeep K. Govil, Daniel N. Galburt, David Callan 2000-08-01
6013401 Method of controlling illumination field to reduce line width variation Pradeep K. Govil, Daniel N. Galburt, David Callan 2000-01-11
5973764 Vacuum assisted debris removal system Sean Olson 1999-10-26
5966202 Adjustable slit 1999-10-12
5896188 Reduction of pattern noise in scanning lithographic system illuminators 1999-04-20
5895737 Method for adjusting an illumination field based on selected reticle feature Pradeep K. Govil 1999-04-20
5767523 Multiple detector alignment system for photolithography 1998-06-16
5079131 Method of forming positive images through organometallic treatment of negative acid hardening cross-linked photoresist formulations James W. Thackeray 1992-01-07