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Converged test platforms and processes for class and system testing of integrated circuits |
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Package testing system and method with contact alignment |
Mohanraj Prabhugoud, Andrew Hoitink, Joe Walczyk |
2019-06-18 |
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Increased processing efficiency for optical spectral analyzers |
Brett E. Klehn |
2019-05-21 |
| 10247773 |
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Integrated circuit test temperature control mechanism |
John C. Johnson, James G. Maveety, James Neeb |
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Integrated circuit testing architecture |
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2016-11-29 |
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Integrated circuit test temperature control mechanism |
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2016-07-26 |
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Micro positioning test socket and methods for active precision alignment and co-planarity feedback |
Todd P. Albertson, David Shia |
2016-02-09 |
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Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths |
Chukwunenye S. Nnebe, Brett D. Grossman |
2015-06-16 |
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Method and apparatus for an optical interconnect system |
Chukwunenye S. Nnebe, Jin Yang, Tak M. Mak, Sasha N. Oster |
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| 8710858 |
Micro positioning test socket and methods for active precision alignment and co-planarity feedback |
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2014-04-29 |
| 7233163 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
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| 7071723 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
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