Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12135460 | Stackable photonics die with direct optical interconnect | Todd Coons, Michael Rutigliano, Joe Walczyk | 2024-11-05 |
| 12061230 | Active optical plug to optically or electrically test a photonics package | Todd Coons, Michael Rutigliano, Joe Walczyk | 2024-08-13 |
| 10677845 | Converged test platforms and processes for class and system testing of integrated circuits | Evan M. Fledell, Mustapha Amadu Abdulai, John M. Peterson, Dinia P. Kitendaugh, Pooya Tadayon +2 more | 2020-06-09 |
| 10324112 | Package testing system and method with contact alignment | Mohanraj Prabhugoud, Andrew Hoitink, Joe Walczyk | 2019-06-18 |
| 10295406 | Increased processing efficiency for optical spectral analyzers | Brett E. Klehn | 2019-05-21 |
| 10247773 | Systems and methods for wireless device testing | Sankaran M. Menon, Rehan Sheikh, Rolf Kuehnis, John M. Peterson, Asifur Rahman +1 more | 2019-04-02 |
| 9869714 | Integrated circuit test temperature control mechanism | John C. Johnson, James G. Maveety, James Neeb | 2018-01-16 |
| 9506980 | Integrated circuit testing architecture | Brett D. Grossman, Jin Pan, John M. Peterson, Ronald K. Minemier | 2016-11-29 |
| 9400291 | Integrated circuit test temperature control mechanism | John C. Johnson, James G. Maveety, James Neeb | 2016-07-26 |
| 9255945 | Micro positioning test socket and methods for active precision alignment and co-planarity feedback | Todd P. Albertson, David Shia | 2016-02-09 |
| 9059803 | Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths | Chukwunenye S. Nnebe, Brett D. Grossman | 2015-06-16 |
| 8926196 | Method and apparatus for an optical interconnect system | Chukwunenye S. Nnebe, Jin Yang, Tak M. Mak, Sasha N. Oster | 2015-01-06 |
| 8710858 | Micro positioning test socket and methods for active precision alignment and co-planarity feedback | Todd P. Albertson, David Shia | 2014-04-29 |
| 7233163 | Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit | Arun Krishnamoorthy | 2007-06-19 |
| 7071723 | Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit | Arun Krishnamoorthy | 2006-07-04 |