Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10677845 | Converged test platforms and processes for class and system testing of integrated circuits | Abram M. Detofsky, Evan M. Fledell, Mustapha Amadu Abdulai, John M. Peterson, Pooya Tadayon +2 more | 2020-06-09 |
| 9128121 | Mechanism for facilitating a dynamic electro-mechanical interconnect having a cavity for embedding electrical components and isolating electrical paths | Evan M. Fledell, Joe Walczyk | 2015-09-08 |