| 11598804 |
Debug tool for test instruments coupled to a device under test |
Jesse Armagost, Nathan S. Blackwell, Matthew Boelter, Geoffrey Oliver Kelly, Sundar V. PATHY +2 more |
2023-03-07 |
| 11193975 |
Compressed test patterns for a field programmable gate array |
Christopher J. Nelson, Shelby G. ROLLINS, Hiren V. Tilala, Matthew Hendricks, Sundar V. PATHY +4 more |
2021-12-07 |
| 9886401 |
Bus for communication between devices |
Bradly L. Inman, Nathan S. Blackwell |
2018-02-06 |
| 9869714 |
Integrated circuit test temperature control mechanism |
John C. Johnson, James G. Maveety, Abram M. Detofsky |
2018-01-16 |
| 9548284 |
Reduced expansion thermal compression bonding process bond head |
Pramod Malatkar, Hemanth K. Dhavaleswarapu |
2017-01-17 |
| 9454499 |
Asynchronous communication between devices |
Bradly L. Inman, Nathan S. Blackwell |
2016-09-27 |
| 9400291 |
Integrated circuit test temperature control mechanism |
John C. Johnson, James G. Maveety, Abram M. Detofsky |
2016-07-26 |
| 6898852 |
Connector assembly with decoupling capacitors |
Nader N. Abazarnia, Jeffrey H. Luke |
2005-05-31 |
| 6766486 |
Joint test action group (JTAG) tester, such as to test integrated circuits in parallel |
— |
2004-07-20 |
| 6621287 |
Connector assembly with decoupling capacitors |
Nader N. Abazarnia, Jeffrey H. Luke |
2003-09-16 |
| 6559673 |
Apparatus and method for power continuity testing in a parallel testing system |
— |
2003-05-06 |
| 6441637 |
Apparatus and method for power continuity testing in a parallel testing system |
— |
2002-08-27 |
| 6163161 |
Directed self-heating for reduction of system test time |
— |
2000-12-19 |