Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10677845 | Converged test platforms and processes for class and system testing of integrated circuits | Abram M. Detofsky, Evan M. Fledell, Mustapha Amadu Abdulai, John M. Peterson, Dinia P. Kitendaugh +2 more | 2020-06-09 |
| 10469181 | High density low cost wideband production RF test instrument architecture | Erkan Acar, Stephen S. Sturges | 2019-11-05 |
| 10101367 | Microelectronic test device including a probe card having an interposer | Jin Yang, Erkan Acar | 2018-10-16 |
| 9506980 | Integrated circuit testing architecture | Abram M. Detofsky, Brett D. Grossman, John M. Peterson, Ronald K. Minemier | 2016-11-29 |
| 8963135 | Integrated circuits and systems and methods for producing the same | Dmitri E. Nikonov, Robert L. Sankman, Raseong Kim | 2015-02-24 |
| 8891235 | Thermal interface for multi-chip packages | Joseph F. Walczyk, Jin Yang, James G. Maveety, Todd P. Albertson, Ashish Gupta +1 more | 2014-11-18 |
| 7345495 | Temperature and voltage controlled integrated circuit processes | Daniel J. Dangelo, Todd P. Albertson, Hon Lee Kon | 2008-03-18 |
| 7274869 | System and method for providing destination-to-source protection switch setup in optical network topologies | — | 2007-09-25 |
| 6968130 | System and method for fully utilizing available optical transmission spectrum in optical networks | — | 2005-11-22 |
| 6897666 | Embedded voltage regulator and active transient control device in probe head for improved power delivery and method | Tim Swettlen, Hua Zhu, Jun Ding | 2005-05-24 |
| 6577147 | Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic device | Jun Ding | 2003-06-10 |
| 6147786 | Hybrid analog/digital WDM access network with mini-digital optical node | — | 2000-11-14 |