JP

Jin Pan

IN Intel: 9 patents #4,428 of 30,777Top 15%
Nokia: 3 patents #2,812 of 5,652Top 50%
PR Primarion: 1 patents #30 of 42Top 75%
Overall (All Time): #413,990 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10677845 Converged test platforms and processes for class and system testing of integrated circuits Abram M. Detofsky, Evan M. Fledell, Mustapha Amadu Abdulai, John M. Peterson, Dinia P. Kitendaugh +2 more 2020-06-09
10469181 High density low cost wideband production RF test instrument architecture Erkan Acar, Stephen S. Sturges 2019-11-05
10101367 Microelectronic test device including a probe card having an interposer Jin Yang, Erkan Acar 2018-10-16
9506980 Integrated circuit testing architecture Abram M. Detofsky, Brett D. Grossman, John M. Peterson, Ronald K. Minemier 2016-11-29
8963135 Integrated circuits and systems and methods for producing the same Dmitri E. Nikonov, Robert L. Sankman, Raseong Kim 2015-02-24
8891235 Thermal interface for multi-chip packages Joseph F. Walczyk, Jin Yang, James G. Maveety, Todd P. Albertson, Ashish Gupta +1 more 2014-11-18
7345495 Temperature and voltage controlled integrated circuit processes Daniel J. Dangelo, Todd P. Albertson, Hon Lee Kon 2008-03-18
7274869 System and method for providing destination-to-source protection switch setup in optical network topologies 2007-09-25
6968130 System and method for fully utilizing available optical transmission spectrum in optical networks 2005-11-22
6897666 Embedded voltage regulator and active transient control device in probe head for improved power delivery and method Tim Swettlen, Hua Zhu, Jun Ding 2005-05-24
6577147 Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic device Jun Ding 2003-06-10
6147786 Hybrid analog/digital WDM access network with mini-digital optical node 2000-11-14