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Converged test platforms and processes for class and system testing of integrated circuits |
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2020-06-09 |
| 10469181 |
High density low cost wideband production RF test instrument architecture |
Erkan Acar, Stephen S. Sturges |
2019-11-05 |
| 10101367 |
Microelectronic test device including a probe card having an interposer |
Jin Yang, Erkan Acar |
2018-10-16 |
| 9506980 |
Integrated circuit testing architecture |
Abram M. Detofsky, Brett D. Grossman, John M. Peterson, Ronald K. Minemier |
2016-11-29 |
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Integrated circuits and systems and methods for producing the same |
Dmitri E. Nikonov, Robert L. Sankman, Raseong Kim |
2015-02-24 |
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Thermal interface for multi-chip packages |
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2014-11-18 |
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Temperature and voltage controlled integrated circuit processes |
Daniel J. Dangelo, Todd P. Albertson, Hon Lee Kon |
2008-03-18 |
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System and method for providing destination-to-source protection switch setup in optical network topologies |
— |
2007-09-25 |
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System and method for fully utilizing available optical transmission spectrum in optical networks |
— |
2005-11-22 |
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Embedded voltage regulator and active transient control device in probe head for improved power delivery and method |
Tim Swettlen, Hua Zhu, Jun Ding |
2005-05-24 |
| 6577147 |
Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic device |
Jun Ding |
2003-06-10 |
| 6147786 |
Hybrid analog/digital WDM access network with mini-digital optical node |
— |
2000-11-14 |